Y-IrNi菱形十二面体纳米框架的STEM/EDS断层扫描三维重建。

Q3 Immunology and Microbiology Applied Microscopy Pub Date : 2023-09-21 DOI:10.1186/s42649-023-00092-7
Taekyung Kim, Yongsang Lee, Yongju Hong, Kwangyeol Lee, Hionsuck Baik
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引用次数: 0

摘要

通过透射电子显微镜(TEM)对纳米晶体进行结构分析是材料科学领域的一项有价值的技术。最近,通过扫描TEM(STEM)和能量色散X射线光谱(EDS)的二维图像已经成功地扩展到通过断层扫描的三维(3D)成像。然而,尽管改进了TEM仪器和测量技术、探测器阴影、缺楔问题、X射线吸收效应等,但仍然存在重大挑战;因此,在进行定量断层扫描时,应考虑并应用各种所需的校正。尽管如此,这种3D重建技术可以促进活性位点分析和纳米催化剂系统的开发,如水电解和燃料电池。在此,我们提出了一种3D重建技术,通过应用同时迭代重建技术和总变异最小化算法,从STEM和EDS图像中获得IrNi菱形十二面体纳米框架(IrNi RF)的断层图。通过表征纳米框架中Ir和Ni原子的形态和空间化学组成,我们能够推断出IrNi RF的物理和催化耐久性的起源。此外,通过计算3D重建模型的表面积和体积,我们能够量化Ir与Ni的组成比,并将其与EDS测量结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Three-dimensional reconstruction of Y-IrNi rhombic dodecahedron nanoframe by STEM/EDS tomography

The structural analysis of nanocrystals via transmission electron microscopy (TEM) is a valuable technique for the material science field. Recently, two-dimensional images by scanning TEM (STEM) and energy-dispersive X-ray spectroscopy (EDS) have successfully extended to three-dimensional (3D) imaging by tomography. However, despite improving TEM instruments and measurement techniques, detector shadowing, the missing-wedge problem, X-ray absorption effects, etc., significant challenges still remain; therefore, the various required corrections should be considered and applied when performing quantitative tomography. Nonetheless, this 3D reconstruction technique can facilitate active site analysis and the development of nanocatalyst systems, such as water electrolysis and fuel cell. Herein, we present a 3D reconstruction technique to obtain tomograms of IrNi rhombic dodecahedral nanoframes (IrNi-RFs) from STEM and EDS images by applying simultaneous iterative reconstruction technique and total variation minimization algorithms. From characterizing the morphology and spatial chemical composition of the Ir and Ni atoms in the nanoframes, we were able to infer the origin of the physical and catalytic durability of IrNi-RFs. Also, by calculating the surface area and volume of the 3D reconstructed model, we were able to quantify the Ir-to-Ni composition ratio and compare it to the EDS measurement result.

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来源期刊
Applied Microscopy
Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍: Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.
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