高维相关矩阵的测试。

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2019-10-01 Epub Date: 2019-08-03 DOI:10.1214/18-AOS1768
Shurong Zheng, Guanghui Cheng, Jianhua Guo, Hongtu Zhu
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引用次数: 18

摘要

测试相关结构由于其在实际应用中的重要性和几个主要的理论挑战,在文献中引起了广泛的关注。本文的目的是为高维环境下的一个、两个和多个样本测试问题开发一个测试相关性结构的通用框架,当样本大小和数据维度都达到无穷大时。我们的测试统计数据旨在处理密集和稀疏的备选方案。我们系统地研究了每个检验统计量的渐近零分布、幂函数和无偏性。从理论上讲,我们努力处理样本相关矩阵的所有随机矩阵的非独立性。我们使用模拟研究和实际数据分析来说明我们的测试统计的通用性和实用性。
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TEST FOR HIGH DIMENSIONAL CORRELATION MATRICES.

Testing correlation structures has attracted extensive attention in the literature due to both its importance in real applications and several major theoretical challenges. The aim of this paper is to develop a general framework of testing correlation structures for the one-, two-, and multiple sample testing problems under a high-dimensional setting when both the sample size and data dimension go to infinity. Our test statistics are designed to deal with both the dense and sparse alternatives. We systematically investigate the asymptotic null distribution, power function, and unbiasedness of each test statistic. Theoretically, we make great efforts to deal with the non-independency of all random matrices of the sample correlation matrices. We use simulation studies and real data analysis to illustrate the versatility and practicability of our test statistics.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
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