互补金属氧化物半导体图像传感器中介质电泳辅助的三维lc振荡器阵列用于古建筑无标签和损伤检测

IF 0.6 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Nanoelectronics and Optoelectronics Pub Date : 2023-05-01 DOI:10.1166/jno.2023.3431
Xuan Qin, X. Yang
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引用次数: 0

摘要

为了提高古建筑损伤检测的效率和准确性,提出了一种介质电泳辅助的CMOS图像传感器三维lc振荡器阵列,用于古建筑无标签损伤检测,识别损伤区域,实现像素级语义分割。采用Grid-Deeplab模型对受损图像中具有不同重要特征的子区域进行建模。该模型具有区分图像有效区域的能力,从而显著提高了损伤检测模型的效率和精度。以并集上的平均交点为评价标准,利用现有的U-Net、SegNet、FCN和Deeplab模型对所提出的Grid-Deeplab模型进行了验证。结果表明,Grid-Deeplab优化模型在测试集上的平均交集数达到0.77,模型的识别精度和训练效率均优于其他现有模型。
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Dielectrophoresis-Assisted 3D LC-Oscillator Array in Complementary Metal Oxide Semiconductor Image Senser for Label-Free and Damage Detection of Ancient Building
In order to improve the efficiency and accuracy of damage detection of ancient buildings, a dielectrophoresis-assisted 3D LC-oscillator array in CMOS image senser for label-free and damage detection of ancient building is proposed to identify damage areas and achieve pixel-level semantic segmentation. The Grid-Deeplab model is used to model the sub-regions of the damaged image with different importance features. The model has the ability to distinguish the effective area of the image, thereby significantly improve the efficiency and accuracy of the damage detection model. Using the mean intersection over union as the evaluation standard, the proposed Grid-Deeplab model is tested through the data set with the existing U-Net, SegNet, FCN and Deeplab models. The results show that the mean intersection over union of the Grid-Deeplab optimization model on the test set reaches 0.77, and the recognition accuracy and training efficiency of the model are superior to other existing models.
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来源期刊
Journal of Nanoelectronics and Optoelectronics
Journal of Nanoelectronics and Optoelectronics 工程技术-工程:电子与电气
自引率
16.70%
发文量
48
审稿时长
12.5 months
期刊最新文献
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