计算机断层扫描增强芯片分析用于估计芯片分割频率

{"title":"计算机断层扫描增强芯片分析用于估计芯片分割频率","authors":"Daniel Diaz Ocampo, J. Koch, Germán González, F. Zanger, M. Heizmann","doi":"10.1007/s11740-023-01200-y","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":47298,"journal":{"name":"Production Engineering-Research and Development","volume":null,"pages":null},"PeriodicalIF":1.7000,"publicationDate":"2023-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhanced chip analysis with computed tomography for estimation of chip segmentation frequency\",\"authors\":\"Daniel Diaz Ocampo, J. Koch, Germán González, F. Zanger, M. Heizmann\",\"doi\":\"10.1007/s11740-023-01200-y\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":47298,\"journal\":{\"name\":\"Production Engineering-Research and Development\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.7000,\"publicationDate\":\"2023-04-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Production Engineering-Research and Development\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s11740-023-01200-y\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, MANUFACTURING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Production Engineering-Research and Development","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s11740-023-01200-y","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}