{"title":"对神经网络加速器的主动和被动物理攻击","authors":"V. Meyers, Dennis R. E. Gnad, M. Tahoori","doi":"10.1109/MDAT.2023.3253603","DOIUrl":null,"url":null,"abstract":"This article emphasizes the growing importance of studying defenses for physical attacks on neural network accelerators, and describes approaches based on side-channel attacks and fault-injection attacks.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"40 1","pages":"70-85"},"PeriodicalIF":1.9000,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Active and Passive Physical Attacks on Neural Network Accelerators\",\"authors\":\"V. Meyers, Dennis R. E. Gnad, M. Tahoori\",\"doi\":\"10.1109/MDAT.2023.3253603\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article emphasizes the growing importance of studying defenses for physical attacks on neural network accelerators, and describes approaches based on side-channel attacks and fault-injection attacks.\",\"PeriodicalId\":48917,\"journal\":{\"name\":\"IEEE Design & Test\",\"volume\":\"40 1\",\"pages\":\"70-85\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2023-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/MDAT.2023.3253603\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MDAT.2023.3253603","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Active and Passive Physical Attacks on Neural Network Accelerators
This article emphasizes the growing importance of studying defenses for physical attacks on neural network accelerators, and describes approaches based on side-channel attacks and fault-injection attacks.
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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