电阻器中的零点热噪声?结论

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Metrology and Measurement Systems Pub Date : 2023-07-20 DOI:10.24425/MMS.2019.126337
L. Kish
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引用次数: 1

摘要

简要总结了UPoN-2018演讲的要点和听众的一些宝贵意见。该演讲调查了电阻器中零点热噪声的概念及其可见性的主要问题;此外,它还提出了一些新的论点。新的论点支持了Kleen的旧观点,即“显示”零点Johnson噪声的已知测量数据是由能量-时间不确定性原理引起的仪器伪像。我们指出,在黑体辐射的光谱分析过程中,另一个不确定性原理是相关的,即位置-动量不确定性原理,它只会导致谱线的加宽,而不是零点噪声伪影。这就是普朗克公式被黑体辐射实验正确证实的原因。最后给出了宽带放大器零点噪声谱的一个猜想,但该猜想尚待实验验证。
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Zero-point thermal noise in resistors? A conclusion
The main points of the UPoN-2018 talk and some valuable comments from the Audience are briefly summarized. The talk surveyed the major issues with the notion of zero-point thermal noise in resistors and its visibility; moreover it gave some new arguments. The new arguments support the old view of Kleen that the known measurement data “showing” zero-point Johnson noise are instrumental artifacts caused by the energy-time uncertainty principle. We pointed out that, during the spectral analysis of blackbody radiation, another uncertainty principle is relevant, that is, the location-momentum uncertainty principle that causes only the widening of spectral lines instead of the zero-point noise artifact. This is the reason why the Planck formula is correctly confirmed by the blackbody radiation experiments. Finally a conjecture about the zero-point noise spectrum of wide-band amplifiers is shown, but that is yet to be tested experimentally.
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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