EELS法与CBED法测量试件厚度的对比研究

Q3 Immunology and Microbiology Applied Microscopy Pub Date : 2020-05-12 DOI:10.1186/s42649-020-00029-4
Yoon-Uk Heo
{"title":"EELS法与CBED法测量试件厚度的对比研究","authors":"Yoon-Uk Heo","doi":"10.1186/s42649-020-00029-4","DOIUrl":null,"url":null,"abstract":"<p>Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-M?llenstedt (K-M) fringe of the <span>\\( \\mathbf{13}\\overline{\\mathbf{1}} \\)</span> diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72?~?113?nm with a difference of less than 5%.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"50 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-020-00029-4","citationCount":"10","resultStr":"{\"title\":\"Comparative study on the specimen thickness measurement using EELS and CBED methods\",\"authors\":\"Yoon-Uk Heo\",\"doi\":\"10.1186/s42649-020-00029-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-M?llenstedt (K-M) fringe of the <span>\\\\( \\\\mathbf{13}\\\\overline{\\\\mathbf{1}} \\\\)</span> diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72?~?113?nm with a difference of less than 5%.</p>\",\"PeriodicalId\":470,\"journal\":{\"name\":\"Applied Microscopy\",\"volume\":\"50 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-05-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1186/s42649-020-00029-4\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Microscopy\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1186/s42649-020-00029-4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Immunology and Microbiology\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s42649-020-00029-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Immunology and Microbiology","Score":null,"Total":0}
引用次数: 10

摘要

比较了电子能量损失谱(EELS)和10a会聚束电子衍射(CBED)两种测量Fe-18Mn-0.7C合金厚度的方法。首先对薄片试样进行倾斜,使其满足10a双梁条件。在扫描透射电子显微镜(STEM)和TEM-CBED模式下,获得了两束条件下EELS和CBED模式的低损耗谱。采用对数比法测量薄箔厚度。科塞尔- m ?分析了\( \mathbf{13}\overline{\mathbf{1}} \)奥氏体衍射盘的llenstedt (K-M)条纹厚度。结果表明,两种方法在厚度为72?113?Nm,差值小于5%.
本文章由计算机程序翻译,如有差异,请以英文原文为准。

摘要图片

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Comparative study on the specimen thickness measurement using EELS and CBED methods

Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-M?llenstedt (K-M) fringe of the \( \mathbf{13}\overline{\mathbf{1}} \) diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72?~?113?nm with a difference of less than 5%.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Applied Microscopy
Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍: Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.
期刊最新文献
Material analysis on semi-permanent makeup needles Analytical microscopy techniques using coaxial and oblique illuminations to detect thin glass particulates generated from glass vials for parenteral drug products Correction: Microstructural, mechanical, and electrochemical analysis of carbon doped AISI carbon steels In situ observation of catalyst nanoparticle sintering resistance on oxide supports via gas phase transmission electron microscopy Research reviews on myosin head interactions with F-actin
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1