可变波长干涉测量的替代方法

IF 0.5 Q4 OPTICS Photonics Letters of Poland Pub Date : 2020-12-31 DOI:10.4302/PLP.V12I4.1066
D. Litwin, Kamil Radziak, J. Galas
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Pluta, \"Variable wavelength microinterferometry of textile fibres\", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, \"On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane\", Journal of Microscopy, 145(2), 191 (1987). CrossRef M. Pluta, \"Variable wavelength interferometry of birefringent retarders\", Opt. Laser Technology, 19(3), 131 (1987). CrossRef D. Litwin, A. M. Sadik, \"Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers\", Optica Applicata 28(2), 139 (1998). DirectLink A. Sadik, W. A. Ramadan, D. Litwin, \"Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres\", Measurement Science and Technology, IOP Publishing 14(10), 1753 (2003). CrossRef J. Galas, S. Sitarek; D. Litwin; M. Daszkiewicz, \"Fringe image analysis for variable wavelength interferometry\", Proc. SPIE 10445, 1044504 (2017). CrossRef D. Litwin, J. Galas, N. Błocki, \"Automated variable wavelength interferometry in reflected light mode\", Proc.SPIE 6188, 61880F (2006). CrossRef J. Galas, D. Litwin, M. Daszkiewicz, \"New approach for identifying the zero-order fringe in variable wavelength interferometry\", Proc. SPIE 10142, 101421R (2016). CrossRef D. Litwin, J. Galas, M. Daszkiewicz, T. Kryszczyński, A. Czyżewski, K. Radziak, \"Dedicated optical systems of the Institute of Applied Optics\", Phot. Lett. Pol., vol. 11, no. 2, pp. 29-31, (2019). CrossRef D. Litwin, K. Radziak, J. Galas \"A fast variable wavelength interferometer\", Proc. SPIE 11581, 115810O, (2020). 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The discussion includes comparison of the standard deviation between the classical and novel approaches. Full Text: PDF ReferencesM. Pluta, Advanced Light Microscopy (Vol. 3, PWN, Elsevier, Warszawa-Amsterdam-London-New York-Tokyo, 1993). DirectLinkM. Pluta, \\\"Object-adapted variable-wavelength interferometry. I. Theoretical basis\\\", Journal of Opt. Soc. Am., A4(11), 2107 (1987). CrossRef M. Pluta, \\\"Variable wavelength microinterferometry of textile fibres\\\", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, \\\"On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane\\\", Journal of Microscopy, 145(2), 191 (1987). CrossRef M. Pluta, \\\"Variable wavelength interferometry of birefringent retarders\\\", Opt. Laser Technology, 19(3), 131 (1987). CrossRef D. Litwin, A. M. Sadik, \\\"Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers\\\", Optica Applicata 28(2), 139 (1998). 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引用次数: 2

摘要

本文提出了一种计算石英波片延迟的替代技术。该技术利用连续调谐的波长,识别零阶条纹,同时促进整个可见光谱中光程差的高可重复性。与传统方法不同,不需要精确监测干扰阶数的电流增加或减少。讨论包括比较经典方法和新颖方法之间的标准差。全文:PDF参考文献M。Pluta,Advanced Light Microscopy(第3卷,PWN,爱思唯尔,Warszawa阿姆斯特丹,伦敦,纽约,东京,1993年)。DirectLinkM。Pluta,“适用于物体的可变波长干涉测量法。I.理论基础”,《光学杂志》。Soc.Am.,A4(11),2107(1987)。CrossRef M.Pluta,“纺织纤维的可变波长微干涉测量法”,显微镜杂志,149(2),97(1988)。CrossRef M.Pluta,“在图像平面上具有可变环间间距的双折射微干涉仪上”,显微镜杂志,145(2),191(1987)。CrossRef M.Pluta,“双折射延迟器的可变波长干涉测量法”,Opt。激光技术,19(3),131(1987)。CrossRef D.Litwin,A.M.Sadik,“双折射光纤的计算机辅助可变波长傅立叶变换偏振显微镜”,Optica Applicata 28(2),139(1998)。DirectLink A.Sadik,W.A.Ramadan,D.Litwin,“可变入射角法结合Pluta偏振干涉显微镜测量单介质纤维的折射率和厚度”,测量科学与技术,IOP出版14(10),1753(2003)。CrossRef J.Galas,S.Sitarek;D.Litwin;M.Daszkiewicz,“用于可变波长干涉测量的边缘图像分析”,Proc。SPIE 104451044504(2017)。CrossRef D.Litwin,J.Galas,N.Błocki,“反射光模式下的自动可变波长干涉测量法”,Proc.SPIE 6188,61880F(2006)。CrossRef J.Galas,D.Litwin,M.Daszkiewicz,“在可变波长干涉测量中识别零阶条纹的新方法”,Proc。SPIE 1014211021r(2016)。CrossRef D.Litwin,J.Galas,M.Daszkiewicz,T.Kryszczyński,A.Czyżewski,K.Radziak,“应用光学研究所的专用光学系统”,Phot。Lett。Pol。,第11卷,第2期,第29-31页,(2019)。CrossRef D.Litwin,K.Radziak,J.Galas“快速可变波长干涉仪”,Proc。斯皮11581115810o,(2020)。CrossRef
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Alternative approach to variable wavelength interferometry
The paper presents an alternative technique of calculation the retardance of quartz waveplates. The technique utilizes continuously tuned wavelength, which identifies the zero-order fringe and simultaneously facilitates high repeatability of the optical path difference across the entire visible spectrum. Unlike in classical method, precise monitoring of the current increase or decrease of the interference order is not required. The discussion includes comparison of the standard deviation between the classical and novel approaches. Full Text: PDF ReferencesM. Pluta, Advanced Light Microscopy (Vol. 3, PWN, Elsevier, Warszawa-Amsterdam-London-New York-Tokyo, 1993). DirectLinkM. Pluta, "Object-adapted variable-wavelength interferometry. I. Theoretical basis", Journal of Opt. Soc. Am., A4(11), 2107 (1987). CrossRef M. Pluta, "Variable wavelength microinterferometry of textile fibres", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, "On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane", Journal of Microscopy, 145(2), 191 (1987). CrossRef M. Pluta, "Variable wavelength interferometry of birefringent retarders", Opt. Laser Technology, 19(3), 131 (1987). CrossRef D. Litwin, A. M. Sadik, "Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers", Optica Applicata 28(2), 139 (1998). DirectLink A. Sadik, W. A. Ramadan, D. Litwin, "Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres", Measurement Science and Technology, IOP Publishing 14(10), 1753 (2003). CrossRef J. Galas, S. Sitarek; D. Litwin; M. Daszkiewicz, "Fringe image analysis for variable wavelength interferometry", Proc. SPIE 10445, 1044504 (2017). CrossRef D. Litwin, J. Galas, N. Błocki, "Automated variable wavelength interferometry in reflected light mode", Proc.SPIE 6188, 61880F (2006). CrossRef J. Galas, D. Litwin, M. Daszkiewicz, "New approach for identifying the zero-order fringe in variable wavelength interferometry", Proc. SPIE 10142, 101421R (2016). CrossRef D. Litwin, J. Galas, M. Daszkiewicz, T. Kryszczyński, A. Czyżewski, K. Radziak, "Dedicated optical systems of the Institute of Applied Optics", Phot. Lett. Pol., vol. 11, no. 2, pp. 29-31, (2019). CrossRef D. Litwin, K. Radziak, J. Galas "A fast variable wavelength interferometer", Proc. SPIE 11581, 115810O, (2020). CrossRef
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