Abdallah Ouerdane, M. Ghaffour, Z. Hachoun, M. Abdelkrim, M. Bedrouni, Y. Caudano
{"title":"用于气敏应用的掺银SnO2的表征","authors":"Abdallah Ouerdane, M. Ghaffour, Z. Hachoun, M. Abdelkrim, M. Bedrouni, Y. Caudano","doi":"10.18311/JSST/2018/14738","DOIUrl":null,"url":null,"abstract":"We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO 2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO 2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO 2 and the depth reached by Ag into SnO 2 bulk.","PeriodicalId":17031,"journal":{"name":"Journal of Surface Science and Technology","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2018-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of Ag Doped SnO2 for Gas Sensing Application\",\"authors\":\"Abdallah Ouerdane, M. Ghaffour, Z. Hachoun, M. Abdelkrim, M. Bedrouni, Y. Caudano\",\"doi\":\"10.18311/JSST/2018/14738\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO 2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO 2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO 2 and the depth reached by Ag into SnO 2 bulk.\",\"PeriodicalId\":17031,\"journal\":{\"name\":\"Journal of Surface Science and Technology\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Science and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.18311/JSST/2018/14738\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Materials Science\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.18311/JSST/2018/14738","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Materials Science","Score":null,"Total":0}
Characterization of Ag Doped SnO2 for Gas Sensing Application
We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO 2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO 2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO 2 and the depth reached by Ag into SnO 2 bulk.
期刊介绍：
The Indian Society for Surface Science and Technology is an organization for the cultivation, interaction and dissemination of knowledge in the field of surface science and technology. It also strives to promote Industry-Academia interaction
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
