关于$\ell_{1}$-与$\ell_{0}$-正则化的鲁棒性和稳定性：Bertsimas等人和Hastie等人的论文讨论。

{"title":"关于$\\ell_{1}$-与$\\ell_{0}$-正则化的鲁棒性和稳定性：Bertsimas等人和Hastie等人的论文讨论。","authors":"Yuansi Chen, Armeen Taeb, P. Bühlmann","doi":"10.1214/20-sts809","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A Look at Robustness and Stability of $\\\\ell_{1}$-versus $\\\\ell_{0}$-Regularization: Discussion of Papers by Bertsimas et al. and Hastie et al.\",\"authors\":\"Yuansi Chen, Armeen Taeb, P. Bühlmann\",\"doi\":\"10.1214/20-sts809\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"100\",\"ListUrlMain\":\"https://doi.org/10.1214/20-sts809\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1214/20-sts809","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}