Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen
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Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction
Multisite testing, where multiple ICs are tested in parallel sharing the same automatic test equipment, is a widely used method today in IC high-volume test facilities. This article provides a survey of best practices to deal with the problem of site-to-site variation, specifically in the case of analog and mixed-signal ICs.
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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