滤饼内部分离杂质的体模辅助X射线层析成像定量分析

IF 2.8 Q2 ENGINEERING, CHEMICAL ChemEngineering Pub Date : 2023-04-29 DOI:10.3390/chemengineering7030040
Judith Miriam Friebel, Diana Neuber, Thomas Buchwald, Ralf Ditscherlein, U. Peuker
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引用次数: 0

摘要

这项研究提出了一种新的方法来量化由助滤材料组成的滤饼内杂质的沉积量。为此,应用了通过X射线断层扫描的三维成像。根据X射线衰减特性,选择了以硅藻土为助滤剂,硫酸钡为杂质的模型体系。由于杂质颗粒尺寸小于测量装置的空间分辨率,因此需要一种校准方法来深入了解亚体素信息。制备了具有类似材料组成的所谓体模。灰度值与杂质体积分数线性相关,从而产生校准函数,这有助于根据滤饼内部测量的灰度值计算杂质体积分数。给出了第一个结果,表明该方法为所选材料系统提供了有效的结果,并揭示了滤饼结构的意外特征。讨论了幻影方法的挑战及其对所获得结果的影响。
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Quantitative Analysis of Separated Impurities inside Filter Cakes with Phantom-Aided X-ray Tomography
This study presents a new approach in the quantification of the deposited amount of impurity inside a filter cake made up of filter aid material. For this purpose, three-dimensional imaging by X-ray tomography is applied. Based on the X-ray attenuation properties, a model system consisting of kieselguhr as filter aid and barium sulphate as impurity is chosen. Due to the impurity particle size being smaller than the spatial resolution of the measuring setup, a calibration approach is necessary to gain insight into subvoxel information. A so-called phantom of similar material composition is prepared. The grey values are linearly correlated with the impurity volume fraction resulting in a calibration function, which facilitates the calculation of impurity volume fraction based on grey values measured inside the filter cake. First results are presented, showing that the approach delivers valid results for the chosen material system and reveals unexpected characteristics of the filter cake structure. Challenges in the context of the phantom approach and their influence on the obtained results are discussed.
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来源期刊
ChemEngineering
ChemEngineering Engineering-Engineering (all)
CiteScore
4.00
自引率
4.00%
发文量
88
审稿时长
11 weeks
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