抽象NBTI模型

IF 1 Q4 COMPUTER SCIENCE, INFORMATION SYSTEMS IT-Information Technology Pub Date : 2021-09-17 DOI:10.1515/itit-2021-0005

Stephan Adolf, W. Nebel

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引用次数: 0

摘要

摘要负偏置温度不稳定性（NBTI）是晶体管老化的主要影响之一，可能导致系统运行期间的定时故障。因此，人们有兴趣在设计时预测这种影响。在这项工作中，引入了一个抽象NBTI模型，使用两个抽象参数来减少基于陷阱的NBTI模型的状态空间，并应用状态转换来合并可变应力条件。这种转变比传统方法更快。目前，转换为估计的阈值电压损伤是一个非常耗时的过程。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Abstraction NBTI model

Abstract Negative Bias Temperature Instability (NBTI) is one of the major transistor aging effects, possibly leading to timing failures during run-time of a system. Thus one is interested in predicting this effect during design time. In this work an Abstraction NBTI model is introduced reducing the state space of trap-based NBTI models using two abstraction parameters, applying a state transformation to incorporate variable stress conditions. This transformation is faster than traditional approaches. Currently the conversion into estimated threshold voltage damages is a very time consuming process.

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