纳米台面型雪崩光电二极管在恶劣环境应力下的新型失效机制

IF 3.8 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IET Nanodielectrics Pub Date : 2021-02-21 DOI:10.1049/nde2.12001
Jack Jia-Sheng Huang, HsiangSzu Chang, Emin Chou, Yu-Heng Jan, Jin-Wei Shi
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引用次数: 1

摘要

雪崩光电二极管(APD)具有高带宽和低噪声的性能,是一种不可或缺的接收元件。近年来,APD在高温高湿等恶劣环境应力下的可靠性在无源光网络、无线、军事和自由空间光学等领域引起了人们的极大兴趣。作者研究了APD在高湿度和高偏压的恶劣环境下的降解。通过横截面扫描电子显微镜显示了失效形态,并建立了一个基于电化学氧化的新的水分降解模型来解释失效机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Novel failure mechanism of nanoscale mesa-type avalanche photodiodes under harsh environmental stresses

Avalanche photodiode (APD) is an indispensable receiver component because of its high bandwidth and low noise performance. Recently, APD reliability, under harsh environmental stresses such as high heat and humidity, has drawn great interest in the applications of passive optical network, wireless, military, and free space optics. The authors study the APD degradation under the harsh environment of high humidity and high bias. The failure morphology through cross-sectional scanning electron microscopy is shown, and a new moisture degradation model based on electrochemical oxidation to account for the failure mechanism is developed.

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来源期刊
IET Nanodielectrics
IET Nanodielectrics Materials Science-Materials Chemistry
CiteScore
5.60
自引率
3.70%
发文量
7
审稿时长
21 weeks
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