纳米台面型雪崩光电二极管在恶劣环境应力下的新型失效机制

IF 3.8 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IET Nanodielectrics Pub Date : 2021-02-21 DOI:10.1049/nde2.12001
Jack Jia-Sheng Huang, HsiangSzu Chang, Emin Chou, Yu-Heng Jan, Jin-Wei Shi
{"title":"纳米台面型雪崩光电二极管在恶劣环境应力下的新型失效机制","authors":"Jack Jia-Sheng Huang,&nbsp;HsiangSzu Chang,&nbsp;Emin Chou,&nbsp;Yu-Heng Jan,&nbsp;Jin-Wei Shi","doi":"10.1049/nde2.12001","DOIUrl":null,"url":null,"abstract":"<p>Avalanche photodiode (APD) is an indispensable receiver component because of its high bandwidth and low noise performance. Recently, APD reliability, under harsh environmental stresses such as high heat and humidity, has drawn great interest in the applications of passive optical network, wireless, military, and free space optics. The authors study the APD degradation under the harsh environment of high humidity and high bias. The failure morphology through cross-sectional scanning electron microscopy is shown, and a new moisture degradation model based on electrochemical oxidation to account for the failure mechanism is developed.</p>","PeriodicalId":36855,"journal":{"name":"IET Nanodielectrics","volume":null,"pages":null},"PeriodicalIF":3.8000,"publicationDate":"2021-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/nde2.12001","citationCount":"1","resultStr":"{\"title\":\"Novel failure mechanism of nanoscale mesa-type avalanche photodiodes under harsh environmental stresses\",\"authors\":\"Jack Jia-Sheng Huang,&nbsp;HsiangSzu Chang,&nbsp;Emin Chou,&nbsp;Yu-Heng Jan,&nbsp;Jin-Wei Shi\",\"doi\":\"10.1049/nde2.12001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Avalanche photodiode (APD) is an indispensable receiver component because of its high bandwidth and low noise performance. Recently, APD reliability, under harsh environmental stresses such as high heat and humidity, has drawn great interest in the applications of passive optical network, wireless, military, and free space optics. The authors study the APD degradation under the harsh environment of high humidity and high bias. The failure morphology through cross-sectional scanning electron microscopy is shown, and a new moisture degradation model based on electrochemical oxidation to account for the failure mechanism is developed.</p>\",\"PeriodicalId\":36855,\"journal\":{\"name\":\"IET Nanodielectrics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.8000,\"publicationDate\":\"2021-02-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/nde2.12001\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IET Nanodielectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1049/nde2.12001\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IET Nanodielectrics","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/nde2.12001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1

摘要

雪崩光电二极管(APD)具有高带宽和低噪声的性能,是一种不可或缺的接收元件。近年来,APD在高温高湿等恶劣环境应力下的可靠性在无源光网络、无线、军事和自由空间光学等领域引起了人们的极大兴趣。作者研究了APD在高湿度和高偏压的恶劣环境下的降解。通过横截面扫描电子显微镜显示了失效形态,并建立了一个基于电化学氧化的新的水分降解模型来解释失效机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

摘要图片

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Novel failure mechanism of nanoscale mesa-type avalanche photodiodes under harsh environmental stresses

Avalanche photodiode (APD) is an indispensable receiver component because of its high bandwidth and low noise performance. Recently, APD reliability, under harsh environmental stresses such as high heat and humidity, has drawn great interest in the applications of passive optical network, wireless, military, and free space optics. The authors study the APD degradation under the harsh environment of high humidity and high bias. The failure morphology through cross-sectional scanning electron microscopy is shown, and a new moisture degradation model based on electrochemical oxidation to account for the failure mechanism is developed.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
IET Nanodielectrics
IET Nanodielectrics Materials Science-Materials Chemistry
CiteScore
5.60
自引率
3.70%
发文量
7
审稿时长
21 weeks
期刊最新文献
A combined technique for power transformer fault diagnosis based on k-means clustering and support vector machine Stability of giant dielectric properties in co‐doped rutile TiO2 ceramics under temperature and humidity High‐performance sulphur dioxide sensor: Unveiling the potential of photonic crystal fibre technology Improvement in non-linear electrical conductivity of silicone rubber by incorporating zinc oxide fillers and grafting small polar molecules Traditional fault diagnosis methods for mineral oil-immersed power transformer based on dissolved gas analysis: Past, present and future
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1