Hong-Zhuan Chen , Fei Chu , Wen-Tao Lu , Tie-Liang Zhang , Wen-Chang Li , Wei Gao
{"title":"带指数曲率补偿的可调带隙参考电路","authors":"Hong-Zhuan Chen , Fei Chu , Wen-Tao Lu , Tie-Liang Zhang , Wen-Chang Li , Wei Gao","doi":"10.1016/j.jnlest.2023.100216","DOIUrl":null,"url":null,"abstract":"<div><p>This paper proposes an improved exponential curvature-compensated bandgap reference circuit to exploit the exponential relationship between the current gain <em>β</em> of the bipolar junction transistor (BJT) and the temperature as well as reduce the influence of resistance-temperature dependency. Considering the degraded circuit performance caused by the process deviation, the trimmable module of the temperature coefficient (TC) is introduced to improve the circuit stability. The circuit has the advantages of simple structure, high linear stability, high TC accuracy, and trimmable TC. It consumes an area of 0.09 mm<sup>2</sup> when fabricated by using the 0.25-μm complementary metal-oxide-semiconductor (CMOS) process. The proposed circuit achieves the simulated power supply rejection (PSR) of about −78.7 dB@1 kHz, the measured TC of ∼4.7 ppm/°C over a wide temperature range from −55 °C to 125 °C with the 2.5-V single-supply voltage, and the tested line regulation of 0.10 mV/V. Such a high-performance bandgap reference circuit can be widely applied in high-precision and high-reliability electronic systems.</p></div>","PeriodicalId":53467,"journal":{"name":"Journal of Electronic Science and Technology","volume":"21 3","pages":"Article 100216"},"PeriodicalIF":0.0000,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Trimmable bandgap reference circuit with exponential curvature compensation\",\"authors\":\"Hong-Zhuan Chen , Fei Chu , Wen-Tao Lu , Tie-Liang Zhang , Wen-Chang Li , Wei Gao\",\"doi\":\"10.1016/j.jnlest.2023.100216\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This paper proposes an improved exponential curvature-compensated bandgap reference circuit to exploit the exponential relationship between the current gain <em>β</em> of the bipolar junction transistor (BJT) and the temperature as well as reduce the influence of resistance-temperature dependency. Considering the degraded circuit performance caused by the process deviation, the trimmable module of the temperature coefficient (TC) is introduced to improve the circuit stability. The circuit has the advantages of simple structure, high linear stability, high TC accuracy, and trimmable TC. It consumes an area of 0.09 mm<sup>2</sup> when fabricated by using the 0.25-μm complementary metal-oxide-semiconductor (CMOS) process. The proposed circuit achieves the simulated power supply rejection (PSR) of about −78.7 dB@1 kHz, the measured TC of ∼4.7 ppm/°C over a wide temperature range from −55 °C to 125 °C with the 2.5-V single-supply voltage, and the tested line regulation of 0.10 mV/V. Such a high-performance bandgap reference circuit can be widely applied in high-precision and high-reliability electronic systems.</p></div>\",\"PeriodicalId\":53467,\"journal\":{\"name\":\"Journal of Electronic Science and Technology\",\"volume\":\"21 3\",\"pages\":\"Article 100216\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Science and Technology\",\"FirstCategoryId\":\"95\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1674862X23000344\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Science and Technology","FirstCategoryId":"95","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1674862X23000344","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Engineering","Score":null,"Total":0}
Trimmable bandgap reference circuit with exponential curvature compensation
This paper proposes an improved exponential curvature-compensated bandgap reference circuit to exploit the exponential relationship between the current gain β of the bipolar junction transistor (BJT) and the temperature as well as reduce the influence of resistance-temperature dependency. Considering the degraded circuit performance caused by the process deviation, the trimmable module of the temperature coefficient (TC) is introduced to improve the circuit stability. The circuit has the advantages of simple structure, high linear stability, high TC accuracy, and trimmable TC. It consumes an area of 0.09 mm2 when fabricated by using the 0.25-μm complementary metal-oxide-semiconductor (CMOS) process. The proposed circuit achieves the simulated power supply rejection (PSR) of about −78.7 dB@1 kHz, the measured TC of ∼4.7 ppm/°C over a wide temperature range from −55 °C to 125 °C with the 2.5-V single-supply voltage, and the tested line regulation of 0.10 mV/V. Such a high-performance bandgap reference circuit can be widely applied in high-precision and high-reliability electronic systems.
期刊介绍:
JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.