使用CMOS特性曲线的超低电压模拟电路设计技术:实用教程

A. Girardi, Lucas Compassi-Severo, Paulo César Comassetto de Aguirre
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引用次数: 3

摘要

在物联网应用中使用超低电压(ULV)模拟电路,降低功耗是强制性规范,正成为越来越重要的设计方法。此外,在许多物联网应用中,电力是由从环境中收集的能量提供的。电路在接近能量收集器提供的电压水平(在0.3和0.6 V之间)下工作效率更高。当使用低成本技术工艺节点(例如,180纳米,|VT|≈0.5V)时,为了解决这个问题,有必要应用特定的设计技术,利用反向短通道效应、正向体偏置(FBB)或体驱动电路。当在目标工艺节点上可用时,使用低vt晶体管也是一个很好的选择。本文从设计者的角度全面介绍了现代CMOS超低电压设计技术,包括设计权衡和对设计决策的评论。给出了四个ULV电路的逐步设计示例:交叉耦合负变换器,作为模拟放大器的CMOS逆变器,基于伪差分逆变器的放大器,以及带有源负载的体积驱动差分放大器。所有的设计都需要在中反转和弱反转区域中对晶体管进行偏置。目标是证明使用电源电压远低于标称VDD的标准vt晶体管设计ULV模拟电路是可能的。
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Design Techniques for Ultra-Low Voltage Analog Circuits Using CMOS Characteristic Curves: a practical tutorial
The use of ultra-low-voltage (ULV) analog circuits for IoT applications, in which reduced power consumption is a mandatory specification, is becoming more and morean important design approach. Also, in many IoT applications, power is supplied with energy harvested from environmental sources. It is more efficient for the circuit to operate at a voltage level close to the provided by the energy harvester (between 0.3 and 0.6 V). To deal with this when using low-cost technology process nodes - 180-nm, for example, with |VT| ≈0.5V - it is necessary to apply specific design techniques that take advantage of reverse short channel effect, forward bulk bias-ing (FBB) or bulk-driven circuits. The use of low-VT transistors is also a good alternative when they are available inthe target process node. This paper presents a comprehensive scenery about modern CMOS ULV design techniques from the designer’s point of view, including design trade-offs and comments about design decisions. Four step-by-step design examples of ULV circuits are presented: a cross-coupled negative transconductor, a CMOS inverter as an analog amplifier, a pseudo-differential inverter-based amplifier, and a bulk-driven differential amplifier with active load. All designs require the biasing of transistors in moderate and weak inversion regions.The goal is to demonstrate that it is possible to design ULV analog circuits using standard-VT transistors with a supply voltage much lower than the nominal VDD.
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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