{"title":"特邀编辑的话","authors":"Fernanda Lima Kastensmidt, S. C. Asensi","doi":"10.29292/jics.v16i3.575","DOIUrl":null,"url":null,"abstract":"This Special Issues brings four invited papers that describe the state of the art techniques to improve fault tolerance on complex designs. Integrated circuits operating under radiation can experience undesirable faults that must be evaluated and mitigated. Mitigation can be implemented by redundancy in hardware or in software, and by selecting and protecting the most critical parts of the system. Radiation effects test and analysis also play an important step in identifying the criticality of the system and helping designers to better apply fault mitigation techniques.","PeriodicalId":39974,"journal":{"name":"Journal of Integrated Circuits and Systems","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Guest Editors' Words\",\"authors\":\"Fernanda Lima Kastensmidt, S. C. Asensi\",\"doi\":\"10.29292/jics.v16i3.575\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This Special Issues brings four invited papers that describe the state of the art techniques to improve fault tolerance on complex designs. Integrated circuits operating under radiation can experience undesirable faults that must be evaluated and mitigated. Mitigation can be implemented by redundancy in hardware or in software, and by selecting and protecting the most critical parts of the system. Radiation effects test and analysis also play an important step in identifying the criticality of the system and helping designers to better apply fault mitigation techniques.\",\"PeriodicalId\":39974,\"journal\":{\"name\":\"Journal of Integrated Circuits and Systems\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-02-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Integrated Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.29292/jics.v16i3.575\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29292/jics.v16i3.575","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
This Special Issues brings four invited papers that describe the state of the art techniques to improve fault tolerance on complex designs. Integrated circuits operating under radiation can experience undesirable faults that must be evaluated and mitigated. Mitigation can be implemented by redundancy in hardware or in software, and by selecting and protecting the most critical parts of the system. Radiation effects test and analysis also play an important step in identifying the criticality of the system and helping designers to better apply fault mitigation techniques.
期刊介绍：
This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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