不同温度分布对多层BGA封装的影响

IF 0.7 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics International Pub Date : 2021-02-26 DOI:10.1108/MI-10-2020-0066
L. H. Tung, Fei Chong Ng, A. Abas, M. Z. Abdullah, Zambri Samsudin, M. Y. Tura Ali
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引用次数: 0

摘要

目的通过相关研究确定最佳温度组合,以获得多层球栅阵列(BGA)芯片中最有效的下填料毛细流动。设计/方法/方法仿真中采用有限体积法。建立了一种三层多堆BGA模型来模拟下填土的流动。所建立的模拟模型与前人的下填过程实验结果吻合较好。发现充填时间的回归r平方值高达0.9918,表明由于热δ的加入,充填过程明显加速。在多层叠BGA中引入11°C的热增量,可将填充时间缩短16.4%。实际意义温度诱导毛细管流动是一种相对较新的驱动下填料,专为包对包BGA组件设计。它的简单实施可以进一步提高行业中现有底填工艺的生产率,这在减少工艺交货时间方面是可取的。利用统计相关性研究温度诱导下充填体毛细管流动对多堆BGA的影响是一个比较新的课题,据笔者所知尚未有其他研究报道。
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Effect of different temperature distribution on multi-stack BGA package
Purpose This paper aims to determine the optimum set of temperatures through correlation study to attain the most effective capillary flow of underfill in a multi-stack ball grid array (BGA) chip device. Design/methodology/approach Finite volume method is implemented in the simulation. A three-layer multi-stack BGA is modeled to simulate the underfill flow. The simulated models were well validated with the previous experimental work on underfill process. Findings The completion filling time shows high regression R-squared value of up to 0.9918, which indicates a substantial acceleration on the underfill process because of incorporation of thermal delta. An introduction of 11 °C thermal delta to the multi-stacks BGA managed to reduce the filling time by up to 16.4%. Practical implications Temperature-induced capillary flow is a relatively new type of driven underfill designed specifically for package on package BGA components. Its simple implementation can further improve the productivity of existing underfill process in the industry that is desirable in reducing the process lead time. Originality/value The effect of temperature-induced capillary flow in underfill encapsulation on multi-stacks BGA by means of statistical correlation study is a relatively new topic, which has never been reported in any other research according to the authors’ knowledge.
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来源期刊
Microelectronics International
Microelectronics International 工程技术-材料科学:综合
CiteScore
1.90
自引率
9.10%
发文量
28
审稿时长
>12 weeks
期刊介绍: Microelectronics International provides an authoritative, international and independent forum for the critical evaluation and dissemination of research and development, applications, processes and current practices relating to advanced packaging, micro-circuit engineering, interconnection, semiconductor technology and systems engineering. It represents a current, comprehensive and practical information tool. The Editor, Dr John Atkinson, welcomes contributions to the journal including technical papers, research papers, case studies and review papers for publication. Please view the Author Guidelines for further details. Microelectronics International comprises a multi-disciplinary study of the key technologies and related issues associated with the design, manufacture, assembly and various applications of miniaturized electronic devices and advanced packages. Among the broad range of topics covered are: • Advanced packaging • Ceramics • Chip attachment • Chip on board (COB) • Chip scale packaging • Flexible substrates • MEMS • Micro-circuit technology • Microelectronic materials • Multichip modules (MCMs) • Organic/polymer electronics • Printed electronics • Semiconductor technology • Solid state sensors • Thermal management • Thick/thin film technology • Wafer scale processing.
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