{"title":"渐进式ⅱ型右截样本下双参数瑞利分布产品寿命性能指标评估","authors":"Huijun Yi, Danush K. Wijekularathna","doi":"10.1285/I20705948V13N1P31","DOIUrl":null,"url":null,"abstract":"In practice, process capability indices (PCIs) are widely used in the field of quality control. The lifetime performance index ( C L ) is used to measure process potential and performance, where L is the lower specification limit. In this paper, we apply data transformation technology to construct a maximum likelihood estimator (MLE) of C L under the two-parameter Rayleigh distribution based on the progressively type II right censored sample. The MLE of C L is then utilized to develop a hypothesis testing procedure. Finally, we give the Monte Carlo power simulation to assess the behavior of the lifetime perform index.","PeriodicalId":44770,"journal":{"name":"Electronic Journal of Applied Statistical Analysis","volume":"13 1","pages":"31-46"},"PeriodicalIF":0.6000,"publicationDate":"2020-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Assessing the lifetime performance index of products with two-parameter Rayleigh Distribution under progressively type II right censored samples\",\"authors\":\"Huijun Yi, Danush K. Wijekularathna\",\"doi\":\"10.1285/I20705948V13N1P31\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In practice, process capability indices (PCIs) are widely used in the field of quality control. The lifetime performance index ( C L ) is used to measure process potential and performance, where L is the lower specification limit. In this paper, we apply data transformation technology to construct a maximum likelihood estimator (MLE) of C L under the two-parameter Rayleigh distribution based on the progressively type II right censored sample. The MLE of C L is then utilized to develop a hypothesis testing procedure. Finally, we give the Monte Carlo power simulation to assess the behavior of the lifetime perform index.\",\"PeriodicalId\":44770,\"journal\":{\"name\":\"Electronic Journal of Applied Statistical Analysis\",\"volume\":\"13 1\",\"pages\":\"31-46\"},\"PeriodicalIF\":0.6000,\"publicationDate\":\"2020-02-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electronic Journal of Applied Statistical Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1285/I20705948V13N1P31\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"STATISTICS & PROBABILITY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronic Journal of Applied Statistical Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1285/I20705948V13N1P31","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"STATISTICS & PROBABILITY","Score":null,"Total":0}
Assessing the lifetime performance index of products with two-parameter Rayleigh Distribution under progressively type II right censored samples
In practice, process capability indices (PCIs) are widely used in the field of quality control. The lifetime performance index ( C L ) is used to measure process potential and performance, where L is the lower specification limit. In this paper, we apply data transformation technology to construct a maximum likelihood estimator (MLE) of C L under the two-parameter Rayleigh distribution based on the progressively type II right censored sample. The MLE of C L is then utilized to develop a hypothesis testing procedure. Finally, we give the Monte Carlo power simulation to assess the behavior of the lifetime perform index.