Variational Iteration Method for Prediction of the Pull-In Instability Condition of Micro/Nanoelectromechanical Systems

The dynamics of micro/nanoelectromechanical systems (M/NEMS) is a core research area in micromechanics. Due to the nonlinearities and the singular nature of actuation forces that emerge in these systems, it has become a promising and challenging research area. The foremost objective of this manuscript is to examine the dynamics of M/NEMS by approximating rational terms involved in M/NEMS structures. An M/NEMS switch under electromagnetic force is adopted to reveal the effectiveness of the expansion of rational terms. Taylor series is employed to approximate the rational function into the summation of simple terms. The well-known variational iteration method is engaged to obtain the dynamic pull-in threshold value, the nonlinear frequency, and the analytical solution of the objective system. The solution obtained from the proposed strategy exhibits good agreement with observations obtained numerically. As opposed to the existing approaches, the suggested scheme achieves a high level of accuracy.