{"title":"再论ADC线性度测试的直方图法:输入信号和输入频率与采样频率之比的检验","authors":"Yujie Zhao, Kentaroh Katoh, A. Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, K. Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa","doi":"10.1007/s10836-022-05988-y","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"21 - 38"},"PeriodicalIF":1.1000,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies\",\"authors\":\"Yujie Zhao, Kentaroh Katoh, A. Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, K. Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa\",\"doi\":\"10.1007/s10836-022-05988-y\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":54841,\"journal\":{\"name\":\"Journal of Electronic Testing-Theory and Applications\",\"volume\":\"38 1\",\"pages\":\"21 - 38\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2022-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Testing-Theory and Applications\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1007/s10836-022-05988-y\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Testing-Theory and Applications","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1007/s10836-022-05988-y","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
期刊介绍：
The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal''s peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.
Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:
Testing of VLSI devices printed circuit boards, and electronic systems;
Testing of analog and digital electronic circuits;
Testing of microprocessors, memories, and signal processing devices;
Fault modeling;
Test generation;
Fault simulation;
Testability analysis;
Design for testability;
Synthesis for testability;
Built-in self-test;
Test specification;
Fault tolerance;
Formal verification of hardware;
Simulation for verification;
Design debugging;
AI methods and expert systems for test and diagnosis;
Automatic test equipment (ATE);
Test fixtures;
Electron Beam Test Systems;
Test programming;
Test data analysis;
Economics of testing;
Quality and reliability;
CAD Tools;
Testing of wafer-scale integration devices;
Testing of reliable systems;
Manufacturing yield and design for yield improvement;
Failure mode analysis and process improvement
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