Pub Date : 2023-11-02DOI: 10.1007/s10836-023-06087-2
Zhenyu Zhao, Xin Chen, Yufan Lu
{"title":"Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection","authors":"Zhenyu Zhao, Xin Chen, Yufan Lu","doi":"10.1007/s10836-023-06087-2","DOIUrl":"https://doi.org/10.1007/s10836-023-06087-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"188 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135933159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms","authors":"Priyajit Bhattacharya, Rahul Bhattacharya, Himasree Deka","doi":"10.1007/s10836-023-06088-1","DOIUrl":"https://doi.org/10.1007/s10836-023-06088-1","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"33 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135273292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-10-12DOI: 10.1007/s10836-023-06082-7
Ying-Chun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang
{"title":"Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN","authors":"Ying-Chun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang","doi":"10.1007/s10836-023-06082-7","DOIUrl":"https://doi.org/10.1007/s10836-023-06082-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136013329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-09-15DOI: 10.1007/s10836-023-06085-4
Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad
{"title":"A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells","authors":"Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad","doi":"10.1007/s10836-023-06085-4","DOIUrl":"https://doi.org/10.1007/s10836-023-06085-4","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135437073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1007/s10836-023-06081-8
Ling Zhang
{"title":"Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns","authors":"Ling Zhang","doi":"10.1007/s10836-023-06081-8","DOIUrl":"https://doi.org/10.1007/s10836-023-06081-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135003946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1007/s10836-023-06079-2
Tapobrata Dhar, Ranit Das, C. Giri, S. Roy
{"title":"Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection","authors":"Tapobrata Dhar, Ranit Das, C. Giri, S. Roy","doi":"10.1007/s10836-023-06079-2","DOIUrl":"https://doi.org/10.1007/s10836-023-06079-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"447 - 463"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42686734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1007/s10836-023-06080-9
Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant
{"title":"Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model","authors":"Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant","doi":"10.1007/s10836-023-06080-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06080-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135002464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1007/s10836-023-06078-3
R. Saravana, ·. M. Lordwin, Cecil Prabhaker, M. Lordwin
{"title":"Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network","authors":"R. Saravana, ·. M. Lordwin, Cecil Prabhaker, M. Lordwin","doi":"10.1007/s10836-023-06078-3","DOIUrl":"https://doi.org/10.1007/s10836-023-06078-3","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"421 - 433"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43937409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1007/s10836-023-06077-4
V. Chippalkatti, R. Biradar, Venkatesh Shenoy, P. Udayakumar
{"title":"Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System","authors":"V. Chippalkatti, R. Biradar, Venkatesh Shenoy, P. Udayakumar","doi":"10.1007/s10836-023-06077-4","DOIUrl":"https://doi.org/10.1007/s10836-023-06077-4","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"501 - 519"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47712604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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