用于增强可见光和氧气灵敏度的InP纳米线器件中的纳米接触紊乱

Yen-Fu Lin , Chia-Hung Chang , Tsu-Chang Hung , Zhaoping Liu , Jiye Fang , Wen-Bin Jian
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引用次数: 1

摘要

通过自种生长方法合成的InP纳米线用于制造由源极、漏极和后门电极组成的场效应晶体管。弱的门控电压依赖性意味着低载流子浓度,而其行为表明在InP纳米线中存在天然n型掺杂。这些InP纳米线器件表现出巨大的室温电阻变化,这引发了一个关于接触电阻的问题。对于低室温电阻器件,采用80 ~ 300 K温度范围内的温度相关电阻研究了InP纳米线中的电子输运,并利用热激活模型进行了分析。对于其他具有高室温电阻的器件,我们考虑纳米接触电阻。考虑了肖特基接触和莫特变跳程(VRH)模型。这两个电阻并联连接得到InP纳米线器件的总接触电阻。在拟合实验数据后,我们估计了有效的肖特基屏障和无序对纳米接触电阻的贡献。有效肖特基势垒和纳米接触肖特基和莫特的VRH电阻被绘制成器件室温电阻的函数,这表明了无序的规模。利用InP纳米线器件的室温电阻,将器件分为纳米线主导器件和触点主导器件。这两种不同类型的设备被用来检查它们的光敏性和气敏性。接触控制的InP纳米线器件通常表现为低暗电流和低光电流,但这些接触控制的器件具有较高的光/暗电流比。该结果揭示了高纳米接触电阻器件的高光敏性。另一方面,在气敏实验中,接触为主的器件在O2下的电阻比在N2下的电阻比也高。
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Nanocontact Disorder in InP Nanowire Devices for the Enhancement of Visible Light and Oxygen Gas Sensitivities

InP nanowires, synthesized through a self-seeded growth approach, are used in the fabrication of field-effect transistors which consist of source, drain, and back-gate electrodes. The weak gating voltage dependence implies low carrier concentrations whereas its behavior reveals native n-type doping in InP nanowires. These InP nanowire devices exhibit a vast variation of room-temperature resistance that raises a question about contact resistance. For devices of low room-temperature resistance, electron transport in InP nanowires is investigated using temperature dependent resistance in the temperature range between 80 and 300 K, and it can be analyzed using the model of thermal activation. For other devices of high room-temperature resistance, we take into account nanocontact resistance. Models of both Schottky contact and Mott's variable range hopping (VRH) are considered. The two resistances are connected in parallel to give total contact resistance of InP nanowire devices. After fitting experimental data by the proposed model, we estimate effective Schottky barriers and disorder contributions to nanocontact resistance. The effective Schottky barrier, and the nanocontact Schottky and Mott's VRH resistances are plotted as a function of the device room-temperature resistance which indicates the scale of disorder. Using room-temperature resistance of InP nanowire devices, the devices are classified into nanowire- or contact-dominated devices. The two different class of devices are used to check their photo- and gas-sensitivities. The contact-dominated InP nanowire devices show low dark current and low photocurrent as usual, but these contact-dominated devices give high ratio of photo- to dark-current. That result reveals a high photo-sensitivity for those devices of high nanocontact resistance. On the other hand, for gas sensing experiments, the contact-dominated devices show as well a high ratio of resistance under O2 to that under N2 gas exposure.

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