基于片上支持向量机分类器的癫痫检测系统的大规模集成实现

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2021-04-26 DOI:10.1049/cds2.12077
Shalini Shanmugam, Selvathi Dharmar
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引用次数: 1

摘要

癫痫是最常见的神经系统疾病之一;它影响着全球数百万人。由于其对健康的危害,对癫痫的研究和分析在生物医学领域受到了相当大的关注。在神经学诊断中,从脑电图(EEG)信号中检测癫痫发作或癫痫的自动装置具有重要作用。本研究工作提出了一种非常大规模的癫痫发作自动检测集成实现系统。分类前,采用离散小波变换(DWT)进行特征提取,采用线性支持向量机进行片上分类。采用多贝西四阶小波三阶小波变换的多相结构,使计算时间最小化。采用并行处理的基于收缩阵列结构的支持向量机分类器有助于降低所提方法的计算复杂度。本研究使用开放获取的脑电图数据集。硬件实现是在现场可编程门阵列(FPGA)上完成的。与现有的片上系统(SoC)和FPGA扣押检测系统进行了比较。
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Very large scale integration implementation of seizure detection system with on-chip support vector machine classifier

Epilepsy is one of the most common neurological disorders; it affects millions of people globally. Because of the risks to health that it causes, the study and analysis of epilepsy have been given considerable attention in the biomedical field. In a neurological diagnosis, an automated device for detecting seizures or epilepsy from an electroencephalogram (EEG) signal has a significant role. This research work proposes a very large scale integration implementation system for the automatic detection of seizures. Before classification, feature extraction was performed by discrete wavelet transform (DWT) and on-chip classification was performed by a linear support vector machine. The polyphase architecture of Daubechies fourth-order wavelet three-level DWT was used to minimize computational time. The systolic array architecture-based support vector machine classifier using parallel processing helps to minimize the computational complexity of the proposed method. This research work uses an open access EEG dataset. Hardware implementation was done on a field-programmable gate array (FPGA). Efficient results were produced compared with the existing system on chip (SoC) and FPGA seizure detection systems.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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