实用论文、文章及应用笔记

K. See
{"title":"实用论文、文章及应用笔记","authors":"K. See","doi":"10.1109/MEMC.2023.10135170","DOIUrl":null,"url":null,"abstract":"Electrostatic discharge (ESD) can affect the performance of an electronic product and one of the ESD coupling paths to the electronic circuit is through the interfacing cables of the product. The first paper, “Extraction of a SPICE Model for Investigating the Cable Discharge Event in Flat Ribbon Cables Based on Transmission Line Theory,” develops a SPICE model for the cable discharge event (CDE) with specific focus on flat ribbon cables (FRCs), which are widely used in many electronic products. The proposed method can also be expanded to the other types of cables to evaluate CDE. With the equivalent circuit, it allows early evaluation of the product's ESD immunity before final design and compliance test.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Practical Papers, Articles and Application Notes\",\"authors\":\"K. See\",\"doi\":\"10.1109/MEMC.2023.10135170\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrostatic discharge (ESD) can affect the performance of an electronic product and one of the ESD coupling paths to the electronic circuit is through the interfacing cables of the product. The first paper, “Extraction of a SPICE Model for Investigating the Cable Discharge Event in Flat Ribbon Cables Based on Transmission Line Theory,” develops a SPICE model for the cable discharge event (CDE) with specific focus on flat ribbon cables (FRCs), which are widely used in many electronic products. The proposed method can also be expanded to the other types of cables to evaluate CDE. With the equivalent circuit, it allows early evaluation of the product's ESD immunity before final design and compliance test.\",\"PeriodicalId\":73281,\"journal\":{\"name\":\"IEEE electromagnetic compatibility magazine\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE electromagnetic compatibility magazine\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMC.2023.10135170\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE electromagnetic compatibility magazine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMC.2023.10135170","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

静电放电(ESD)会影响电子产品的性能,产品的接口电缆是ESD与电子电路耦合的途径之一。第一篇论文“基于传输线理论提取用于研究扁平带状电缆电缆放电事件的SPICE模型”,开发了电缆放电事件(CDE)的SPICE模型,特别关注扁平带状电缆(FRCs),它广泛应用于许多电子产品中。该方法也可推广到其他类型的电缆进行CDE评价。通过等效电路,可以在最终设计和符合性测试之前对产品的ESD抗扰度进行早期评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Practical Papers, Articles and Application Notes
Electrostatic discharge (ESD) can affect the performance of an electronic product and one of the ESD coupling paths to the electronic circuit is through the interfacing cables of the product. The first paper, “Extraction of a SPICE Model for Investigating the Cable Discharge Event in Flat Ribbon Cables Based on Transmission Line Theory,” develops a SPICE model for the cable discharge event (CDE) with specific focus on flat ribbon cables (FRCs), which are widely used in many electronic products. The proposed method can also be expanded to the other types of cables to evaluate CDE. With the equivalent circuit, it allows early evaluation of the product's ESD immunity before final design and compliance test.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
0.80
自引率
0.00%
发文量
0
期刊最新文献
Book Reviews IEEE Latin American Symposium on Circuits and Systems (LASCAS) S-Parameters for High Speed Digital Engineers: A Beginner's Guide Is Amateur Radio Amateur? IEEE Division IV Update
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1