{"title":"傅里叶变换光谱仪干涉调制深度分析","authors":"Rilong Liu","doi":"10.1155/2015/472852","DOIUrl":null,"url":null,"abstract":"Based on the principle of the Michelson interferometer, the paper briefly describes the theoretical significance and calculates and deduces three expressions of the interference modulation depth. The influence of the surface shape error of plane mirror on modulation depth is analyzed, and the tolerance of error is also pointed out. Moreover, the dependence of modulation depth on the reflectance change of beam splitter interface is also analyzed, and the curve is given. It is concluded that this paper is of general significance for the Fourier transform spectrometer based on the principle of the Michelson two-beam interference.","PeriodicalId":7352,"journal":{"name":"Advances in Optoelectronics","volume":"2015 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1155/2015/472852","citationCount":"1","resultStr":"{\"title\":\"Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer\",\"authors\":\"Rilong Liu\",\"doi\":\"10.1155/2015/472852\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Based on the principle of the Michelson interferometer, the paper briefly describes the theoretical significance and calculates and deduces three expressions of the interference modulation depth. The influence of the surface shape error of plane mirror on modulation depth is analyzed, and the tolerance of error is also pointed out. Moreover, the dependence of modulation depth on the reflectance change of beam splitter interface is also analyzed, and the curve is given. It is concluded that this paper is of general significance for the Fourier transform spectrometer based on the principle of the Michelson two-beam interference.\",\"PeriodicalId\":7352,\"journal\":{\"name\":\"Advances in Optoelectronics\",\"volume\":\"2015 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1155/2015/472852\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in Optoelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1155/2015/472852\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/2015/472852","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer
Based on the principle of the Michelson interferometer, the paper briefly describes the theoretical significance and calculates and deduces three expressions of the interference modulation depth. The influence of the surface shape error of plane mirror on modulation depth is analyzed, and the tolerance of error is also pointed out. Moreover, the dependence of modulation depth on the reflectance change of beam splitter interface is also analyzed, and the curve is given. It is concluded that this paper is of general significance for the Fourier transform spectrometer based on the principle of the Michelson two-beam interference.
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Advances in OptoElectronics is a peer-reviewed, open access journal that publishes original research articles as well as review articles in all areas of optoelectronics.
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