{"title":"同步多点低频EMI测量及其应用","authors":"Alexander Matthee;Niek Moonen;Frank Leferink","doi":"10.1109/LEMCPA.2022.3218320","DOIUrl":null,"url":null,"abstract":"Increased implementation of power electronics devices as well as high penetration of micro grids and embedded generation with low-supply inertia is resulting in grid stability problems, especially in transient or startup situations. The electromagnetic compatibility of these systems with regards to transients can be difficult to diagnose due to the short time duration and often intermittent nature of events. This letter proposes a multichannel measurement system which is able to measure voltage and current waveforms in multiple locations with synchronization and sample rates in the megahertz range. The overall design, characteristics, as well as applications are showcased in this letter.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"120-124"},"PeriodicalIF":0.9000,"publicationDate":"2022-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Synchronous Multipoint Low-Frequency EMI Measurement and Applications\",\"authors\":\"Alexander Matthee;Niek Moonen;Frank Leferink\",\"doi\":\"10.1109/LEMCPA.2022.3218320\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Increased implementation of power electronics devices as well as high penetration of micro grids and embedded generation with low-supply inertia is resulting in grid stability problems, especially in transient or startup situations. The electromagnetic compatibility of these systems with regards to transients can be difficult to diagnose due to the short time duration and often intermittent nature of events. This letter proposes a multichannel measurement system which is able to measure voltage and current waveforms in multiple locations with synchronization and sample rates in the megahertz range. The overall design, characteristics, as well as applications are showcased in this letter.\",\"PeriodicalId\":100625,\"journal\":{\"name\":\"IEEE Letters on Electromagnetic Compatibility Practice and Applications\",\"volume\":\"4 4\",\"pages\":\"120-124\"},\"PeriodicalIF\":0.9000,\"publicationDate\":\"2022-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Letters on Electromagnetic Compatibility Practice and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/9933819/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/9933819/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Synchronous Multipoint Low-Frequency EMI Measurement and Applications
Increased implementation of power electronics devices as well as high penetration of micro grids and embedded generation with low-supply inertia is resulting in grid stability problems, especially in transient or startup situations. The electromagnetic compatibility of these systems with regards to transients can be difficult to diagnose due to the short time duration and often intermittent nature of events. This letter proposes a multichannel measurement system which is able to measure voltage and current waveforms in multiple locations with synchronization and sample rates in the megahertz range. The overall design, characteristics, as well as applications are showcased in this letter.