{"title":"一种用于增强直接功率注入传导抗扰度设置的低成本射频检测器","authors":"Alexandre Boyer","doi":"10.1109/LEMCPA.2022.3210876","DOIUrl":null,"url":null,"abstract":"Direct power injection (DPI) is a convenient method to characterize the conducted susceptibility of integrated circuits (ICs). However, a practical issue of this test is that the voltage, current, and impedance of the tested pin remain unknown during the test, even though it can provide valuable information to IC designers about IC failures. This letter presents an enhancement of the standard DPI test based on a commercial and affordable radiofrequency detector, which covers the frequency range of 5 MHz–3 GHz. The proposed approach does not require specific measurement probes and board design constraints. It can be easily inserted in a conventional DPI test bench without any influence on the test results.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"108-113"},"PeriodicalIF":0.9000,"publicationDate":"2022-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Low-Cost RF Detector to Enhance the Direct Power Injection Conducted Immunity Setup\",\"authors\":\"Alexandre Boyer\",\"doi\":\"10.1109/LEMCPA.2022.3210876\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Direct power injection (DPI) is a convenient method to characterize the conducted susceptibility of integrated circuits (ICs). However, a practical issue of this test is that the voltage, current, and impedance of the tested pin remain unknown during the test, even though it can provide valuable information to IC designers about IC failures. This letter presents an enhancement of the standard DPI test based on a commercial and affordable radiofrequency detector, which covers the frequency range of 5 MHz–3 GHz. The proposed approach does not require specific measurement probes and board design constraints. It can be easily inserted in a conventional DPI test bench without any influence on the test results.\",\"PeriodicalId\":100625,\"journal\":{\"name\":\"IEEE Letters on Electromagnetic Compatibility Practice and Applications\",\"volume\":\"4 4\",\"pages\":\"108-113\"},\"PeriodicalIF\":0.9000,\"publicationDate\":\"2022-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Letters on Electromagnetic Compatibility Practice and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/9906450/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/9906450/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A Low-Cost RF Detector to Enhance the Direct Power Injection Conducted Immunity Setup
Direct power injection (DPI) is a convenient method to characterize the conducted susceptibility of integrated circuits (ICs). However, a practical issue of this test is that the voltage, current, and impedance of the tested pin remain unknown during the test, even though it can provide valuable information to IC designers about IC failures. This letter presents an enhancement of the standard DPI test based on a commercial and affordable radiofrequency detector, which covers the frequency range of 5 MHz–3 GHz. The proposed approach does not require specific measurement probes and board design constraints. It can be easily inserted in a conventional DPI test bench without any influence on the test results.