材料加工用O2/HMDSO射频等离子体化学动力学表征

R. Barni, S. Zanini, C. Riccardi
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引用次数: 20

摘要

本文对氧和六甲基二硅氧烷低压射频放电等离子体气相进行了实验研究。用发射光谱法对等离子体相进行了研究。用专用的光谱仪直接对等离子体气相取样,也对中性和带电物质进行了质谱分析。我们也测量了离子的能量分布。我们研究了操作条件对等离子体气相组成的影响,这在SiO2薄膜的形成过程中起着重要的作用,而SiO2薄膜具有重要的应用价值。
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Characterization of the Chemical Kinetics in an O2/HMDSO RF Plasma for Material Processing
Experimental study of the plasma gas phase in low-pressure radiofrequency discharges of oxygen and hexamethyldisiloxane is presented. The plasma phase has been studied by means of optical emission spectroscopy. Mass spectroscopy of the neutral and of the charged species has been performed too, directly sampling the plasma gas phase, by a dedicated spectrometer. We also measured the ion energy distribution. We have studied the influence of the operating conditions on the plasma gas-phase composition which plays a primary role in the formation process of SiO2 films, which are known for their important applicative uses.
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