V. I. Zaĭtsev, Yu. V. Andryanov, G. Volkov, Ye. V. Grabovsky, N. I. Lakhtyushko, A. Kartashov
{"title":"大电流z夹头解体及周边设备保护问题","authors":"V. I. Zaĭtsev, Yu. V. Andryanov, G. Volkov, Ye. V. Grabovsky, N. I. Lakhtyushko, A. Kartashov","doi":"10.1080/10519990701872306","DOIUrl":null,"url":null,"abstract":"The process of Z-pinch decay upon current termination is considered. The experimental data obtained for the Angara-5-1 facility on compression of multiwire tungsten liners are discussed. It is shown that among the decay products there are microparticles of the eroded liner construction material and plasma fluxes. It was determined that the plasma flow velocities exceeded the ‘thermal’ velocities of the Z-pinch plasma. A model for the description of the process of ion acceleration based on an ambipolar mechanism is suggested. Precautions for protection of the peripheral equipment against the decay products of Z-pinch are discussed and protective components are studied. A fast electromagnetic shutter is used for protection from microparticles.","PeriodicalId":54600,"journal":{"name":"Plasma Devices and Operations","volume":"59 1","pages":"61 - 66"},"PeriodicalIF":0.0000,"publicationDate":"2008-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"High-current Z-pinch disintegration and the problem of peripheral equipment protection\",\"authors\":\"V. I. Zaĭtsev, Yu. V. Andryanov, G. Volkov, Ye. V. Grabovsky, N. I. Lakhtyushko, A. Kartashov\",\"doi\":\"10.1080/10519990701872306\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The process of Z-pinch decay upon current termination is considered. The experimental data obtained for the Angara-5-1 facility on compression of multiwire tungsten liners are discussed. It is shown that among the decay products there are microparticles of the eroded liner construction material and plasma fluxes. It was determined that the plasma flow velocities exceeded the ‘thermal’ velocities of the Z-pinch plasma. A model for the description of the process of ion acceleration based on an ambipolar mechanism is suggested. Precautions for protection of the peripheral equipment against the decay products of Z-pinch are discussed and protective components are studied. A fast electromagnetic shutter is used for protection from microparticles.\",\"PeriodicalId\":54600,\"journal\":{\"name\":\"Plasma Devices and Operations\",\"volume\":\"59 1\",\"pages\":\"61 - 66\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Plasma Devices and Operations\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1080/10519990701872306\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Plasma Devices and Operations","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/10519990701872306","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High-current Z-pinch disintegration and the problem of peripheral equipment protection
The process of Z-pinch decay upon current termination is considered. The experimental data obtained for the Angara-5-1 facility on compression of multiwire tungsten liners are discussed. It is shown that among the decay products there are microparticles of the eroded liner construction material and plasma fluxes. It was determined that the plasma flow velocities exceeded the ‘thermal’ velocities of the Z-pinch plasma. A model for the description of the process of ion acceleration based on an ambipolar mechanism is suggested. Precautions for protection of the peripheral equipment against the decay products of Z-pinch are discussed and protective components are studied. A fast electromagnetic shutter is used for protection from microparticles.