利用衬底偏置效应的单比特低功耗全加法器单元

Sakshi Semwal, Dr. Jasdeep Kaur Dhanoa, D. Kumar
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摘要

超低功耗便携式电子设备是现代世界的需要。便携式设备需要延长电池寿命,这可以通过降低功耗来实现。衬底偏置效应是一种降低泄漏功率的技术。它描述了阈值电压相对于源电压到体电压的变化的变化。利用衬底偏置效应控制漏电流。反向偏置电压使耗尽区变宽,从而使阈值电压增加。本文提出了一种具有衬底偏置效应的单比特低功耗全加法器。本文还对低电压高性能混合单比特全加法器单元进行了仿真。通过使用反向偏置技术,我们实现了单比特全加法器单元的功耗降低。在不同的电源电压下,得到了所提出和现有设计的功率、延迟和功率延迟积(PDP)的结果。该设计的PDP为253.38fJ,而1.8 Vdd的低电压高性能混合单比特全加法器单元的PDP为277.23fJ。仿真结果表明,该设计在变温条件下也具有较好的性能。我们还绘制了不同反向偏置电压下的功率延迟积。所有的工作都是在180nm CMOS技术下完成的。
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Single Bit Low Power Full Adder Cell using Substrate Bias Effect
Ultra low power portable electronic devices are the need of modern world. Portable devices need prolonged battery life, which can be achieved by reducing the power dissipation. Substrate bias effect is a leakage power reduction technique. It describes the changes in the threshold voltage with respect to change in source to bulk voltage. The substrate bias effect is used to control the leakage current. The reverse bias voltage widens the depletion region, due to which the threshold voltage increases. In this paper a single bit low power full adder has been proposed with substrate bias effect. Simulation of low voltage high performance hybrid single bit full adder cell also has been presented. By using the reverse biasing technique we have achieved power reduction in the single bit full adder cell. The power, delay and, power delay product (PDP) results have been obtained for proposed and existing designs with varying supply voltages. The proposed design shows PDP of 253.38fJ as compared to 277.23fJ of low voltage high performance hybrid single bit full adder cell at 1.8 Vdd. Simulation result show that the proposed design also performs better at varying temperature conditions. The power delay product has been also plotted versus the different reverse bias voltages applied in the proposed technique. All the work has been done in 180nm CMOS technology.
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