{"title":"EM分析,经典的还是新颖的","authors":"W. Leahy","doi":"10.1109/ISEMC.1992.626043","DOIUrl":null,"url":null,"abstract":"Once the classic approaches relating field theory to EM propagation and attenuation are examined in contrast to the newer approaches (nouvelle approaches) using circuit theory, two questions emerge. First, we must ask, “who’s right?” Second, “who cares?” This paper addresses these two questions and their ramifications to the EM engineer and the EM field.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"25 1","pages":"27-29"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"EM analysis, classic or nouvelle\",\"authors\":\"W. Leahy\",\"doi\":\"10.1109/ISEMC.1992.626043\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Once the classic approaches relating field theory to EM propagation and attenuation are examined in contrast to the newer approaches (nouvelle approaches) using circuit theory, two questions emerge. First, we must ask, “who’s right?” Second, “who cares?” This paper addresses these two questions and their ramifications to the EM engineer and the EM field.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"25 1\",\"pages\":\"27-29\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1992.626043\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626043","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Once the classic approaches relating field theory to EM propagation and attenuation are examined in contrast to the newer approaches (nouvelle approaches) using circuit theory, two questions emerge. First, we must ask, “who’s right?” Second, “who cares?” This paper addresses these two questions and their ramifications to the EM engineer and the EM field.