Implementation of Optical Shearography for Electronic Devices Analysis

The use of non-destructive methods for physical variables estimation in materials characterization has allowed the structural analysis of response when an external excitation force is applied on a study object [1]. Digital shearography is an optical tool used to estimate micro-deformations by processing information collected with an image acquisition system of an object illuminated with coherent light for two deformation states [2]. This technique has many advantages in industrial applications due to its low sensibility to environmental disturbances. In this work are reported the results obtained in the mechanical response analysis of an electronic device used for voltage regulation (LM7805CT). For testing, a bias voltage was applied to reach maximum power dissipation in the device, localizing a deformation surface around six micrometers close to the input pin. Furthermore, the use of a thermal camera revealed that regions with higher temperature correspond to the maximum deformation detected.