{"title":"使用容错技术的缓存电压缩放限制","authors":"Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi","doi":"10.1109/ICCD.2007.4601943","DOIUrl":null,"url":null,"abstract":"This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.","PeriodicalId":6306,"journal":{"name":"2007 25th International Conference on Computer Design","volume":"92 1","pages":"488-495"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Limits on voltage scaling for caches utilizing fault tolerant techniques\",\"authors\":\"Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi\",\"doi\":\"10.1109/ICCD.2007.4601943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.\",\"PeriodicalId\":6306,\"journal\":{\"name\":\"2007 25th International Conference on Computer Design\",\"volume\":\"92 1\",\"pages\":\"488-495\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 25th International Conference on Computer Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.2007.4601943\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 25th International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2007.4601943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Limits on voltage scaling for caches utilizing fault tolerant techniques
This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.