大气压下等离子体聚合膜的局部沉积

K. Fricke, M. Polák, A. Quade, K. Weltmann, A. Schmidt-Bleker, J. Winter, S. Reuter, A. Vogelsang
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引用次数: 0

摘要

最近报道的关于常压条件下薄膜沉积的进展使其在光学,半导体生产,汽车或医疗工业中的应用越来越受到关注。因此,人们对常压等离子体薄膜沉积源的开发进行了广泛的研究。小型化的非热大气压等离子体射流是局部表面涂层的合适工具,因此可以制备化学微图案。因此,研究等离子体射流在表面工程中满足客户特定要求的可行性是很有意义的。到目前为止,已经开发了两种不同几何形状的大气压等离子体射流,可用于此目的1-2。在这些装置中,前驱体的供应可以通过不同的方式实现:I)载气和前驱体的混合物被引入主动排放下游的主流或II)通过使用一个盖子来控制和调整气幕,使其扩散到射流2-3的流出物中。本文给出了常压条件下等离子体增强化学气相沉积的实验研究结果。重点是沉积具有亲水性(如富氮涂层)或疏水性表面特性(如聚四氟乙烯类涂层)的薄膜。这些薄膜的化学结构,由x射线光电子能谱测量,以及他们的润湿性将显示和讨论。沉积速率是通过称重来确定的。因此,通过控制沉积条件,例如富氟薄膜的薄膜生长速率为6-43 nm s-1。
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Local deposition of plasma-polymerized films at atmospheric pressure
Recently reported progress regarding thin film deposition under atmospheric pressure conditions led to increased interests for its application in optics, semiconductor production, automotive, or medical industry. Therefore, extensively research has been performed in the development of atmospheric pressure plasma sources for thin film deposition. Miniaturized non-thermal atmospheric pressure plasma jets represent a suitable tool for local surface coating and thus for the preparation of chemical micro-patterns. Consequently, investigations are of interest concerning the feasibility of plasma jets in surface engineering for customer-specific requirements. So far, two atmospheric pressure plasma jets with different geometries have been developed, which can be used for this purposes 1-2. In these set-ups, the supply of the precursor can be realized in different ways: I) the mixture of carrier gas and precursor is introduced into the main flow downstream the active discharge or II) by using a cap which was build to control and tailor the gas curtain which can diffuse into the effluent of the jet2-3. In the present paper, results are given of an experimental study on plasma enhanced chemical vapor deposition under atmospheric pressure conditions. Emphasis is given on depositing films which exhibit either hydrophilic (e.g. nitrogen-rich coatings) or hydrophobic surface properties (e.g. Teflon-like coatings). The chemical structure of these films, measured by X-ray photo electron spectroscopy, as well as their wettability will be shown and discussed. Deposition rates have been determined by weighing. Hence, by controlling the deposition conditions film growth rates of 6-43 nm s-1 have been obtained for fluorine-rich films, for example.
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