{"title":"一种宽带自由空间介电测量系统","authors":"N. Zhang, Junjie Cheng, Peng-wei Gong, Hongmei Ma","doi":"10.1109/IMWS-AMP.2015.7324930","DOIUrl":null,"url":null,"abstract":"There are two X-band ripples horn single-lens antennas, waveguide transmission segment, fixture, a mounting station, an Agilent N5225A network analyzer and a computer in the free-space measurement system of 8GHz~40GHz frequency range. S11 and S21 of sample measured by network analyzer are used to calculate the dielectric constant. A dual calibration technique of SOLT and GRL is used to eliminate errors due to multiple reflections via the surface of the sample. How the X-band free-space measurement system works at 12.4GHz~40GHz frequency range is introduced and measurement results are reported for some absorbing material.","PeriodicalId":6625,"journal":{"name":"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"6 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A broadband free-space dielectric measurement system\",\"authors\":\"N. Zhang, Junjie Cheng, Peng-wei Gong, Hongmei Ma\",\"doi\":\"10.1109/IMWS-AMP.2015.7324930\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"There are two X-band ripples horn single-lens antennas, waveguide transmission segment, fixture, a mounting station, an Agilent N5225A network analyzer and a computer in the free-space measurement system of 8GHz~40GHz frequency range. S11 and S21 of sample measured by network analyzer are used to calculate the dielectric constant. A dual calibration technique of SOLT and GRL is used to eliminate errors due to multiple reflections via the surface of the sample. How the X-band free-space measurement system works at 12.4GHz~40GHz frequency range is introduced and measurement results are reported for some absorbing material.\",\"PeriodicalId\":6625,\"journal\":{\"name\":\"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)\",\"volume\":\"6 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMWS-AMP.2015.7324930\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS-AMP.2015.7324930","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A broadband free-space dielectric measurement system
There are two X-band ripples horn single-lens antennas, waveguide transmission segment, fixture, a mounting station, an Agilent N5225A network analyzer and a computer in the free-space measurement system of 8GHz~40GHz frequency range. S11 and S21 of sample measured by network analyzer are used to calculate the dielectric constant. A dual calibration technique of SOLT and GRL is used to eliminate errors due to multiple reflections via the surface of the sample. How the X-band free-space measurement system works at 12.4GHz~40GHz frequency range is introduced and measurement results are reported for some absorbing material.
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