{"title":"交流与暂态功率组合分析","authors":"Xunyong Yang, B. Krauter, L. Pileggi","doi":"10.1109/CICC.1996.511088","DOIUrl":null,"url":null,"abstract":"The increased use of noise sensitive circuits and power up or sleep modes, and the high cost of on-chip decoupling have combined to make the VLSI CMOS power distribution problem both a global chip and a local circuit concern. Extensive simulation is required to evaluate the worst case power rail sag due to the enormous possibilities in power up sequences. Moreovel; VLJI CMOS power distribution networks are nonideal in that they fail to provide a low impedance path from the power supply all the way to the circuit terminals over a large range ojjcrequencies [2,3]. Resonant peaks typically litter the impedmce spectrum, even at the chip level [IO], making both transient and steady state analysis necessary. This paper proposes an analysis formulation that eficiently derives both steady state and transient responses from a series of fixed-time point transient impulse response solutions (frequency-shifted moments). This formulation is used to eficiently evaluate worst case power supply sags. Practical examples holving VLSI CMOS power distribution networks are shown which demonstrate that phase-shifts across the chip further complicate the calculation of the worst case voltage sag.","PeriodicalId":74515,"journal":{"name":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","volume":"25 1","pages":"233-"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Combined ac and Transient Power Distribution Analysis\",\"authors\":\"Xunyong Yang, B. Krauter, L. Pileggi\",\"doi\":\"10.1109/CICC.1996.511088\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increased use of noise sensitive circuits and power up or sleep modes, and the high cost of on-chip decoupling have combined to make the VLSI CMOS power distribution problem both a global chip and a local circuit concern. Extensive simulation is required to evaluate the worst case power rail sag due to the enormous possibilities in power up sequences. Moreovel; VLJI CMOS power distribution networks are nonideal in that they fail to provide a low impedance path from the power supply all the way to the circuit terminals over a large range ojjcrequencies [2,3]. Resonant peaks typically litter the impedmce spectrum, even at the chip level [IO], making both transient and steady state analysis necessary. This paper proposes an analysis formulation that eficiently derives both steady state and transient responses from a series of fixed-time point transient impulse response solutions (frequency-shifted moments). This formulation is used to eficiently evaluate worst case power supply sags. Practical examples holving VLSI CMOS power distribution networks are shown which demonstrate that phase-shifts across the chip further complicate the calculation of the worst case voltage sag.\",\"PeriodicalId\":74515,\"journal\":{\"name\":\"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference\",\"volume\":\"25 1\",\"pages\":\"233-\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.1996.511088\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1996.511088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Combined ac and Transient Power Distribution Analysis
The increased use of noise sensitive circuits and power up or sleep modes, and the high cost of on-chip decoupling have combined to make the VLSI CMOS power distribution problem both a global chip and a local circuit concern. Extensive simulation is required to evaluate the worst case power rail sag due to the enormous possibilities in power up sequences. Moreovel; VLJI CMOS power distribution networks are nonideal in that they fail to provide a low impedance path from the power supply all the way to the circuit terminals over a large range ojjcrequencies [2,3]. Resonant peaks typically litter the impedmce spectrum, even at the chip level [IO], making both transient and steady state analysis necessary. This paper proposes an analysis formulation that eficiently derives both steady state and transient responses from a series of fixed-time point transient impulse response solutions (frequency-shifted moments). This formulation is used to eficiently evaluate worst case power supply sags. Practical examples holving VLSI CMOS power distribution networks are shown which demonstrate that phase-shifts across the chip further complicate the calculation of the worst case voltage sag.