{"title":"谁在穿我的衣服?受限个人设备中基于tinydl的用户识别","authors":"Ramon Sanchez-Iborra, Antonio Skarmeta","doi":"10.1049/cdt2.12035","DOIUrl":null,"url":null,"abstract":"<p>Deep learning (DL) techniques have been extensively studied to improve their precision and scalability in a vast range of applications. Recently, a new milestone has been reached driven by the emergence of the TinyDL paradigm, which enables adaptation of complex DL models generated by well-known libraries to the restrictions of constrained microcontroller-based devices. In this work, a comprehensive discussion is provided regarding this novel ecosystem, by identifying the benefits that it will bring to the wearable industry and analysing different TinyDL initiatives promoted by tech giants. The specific use case of automatic user recognition from data captured by a wearable device is also presented. The whole development process by which different DL configurations have been embedded in a real microcontroller unit is described. The attained results in terms of accuracy and resource usage confirm the validity of the proposal, which allows precise predictions in a highly constrained platform with limited input information. Therefore, this work provides insights into the viability of the integration of TinyDL models within wearables, which may be valuable for researchers, practitioners, and makers related to this industry.</p>","PeriodicalId":50383,"journal":{"name":"IET Computers and Digital Techniques","volume":"16 1","pages":"1-9"},"PeriodicalIF":1.1000,"publicationDate":"2021-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/cdt2.12035","citationCount":"1","resultStr":"{\"title\":\"Who is wearing me? TinyDL-based user recognition in constrained personal devices\",\"authors\":\"Ramon Sanchez-Iborra, Antonio Skarmeta\",\"doi\":\"10.1049/cdt2.12035\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Deep learning (DL) techniques have been extensively studied to improve their precision and scalability in a vast range of applications. Recently, a new milestone has been reached driven by the emergence of the TinyDL paradigm, which enables adaptation of complex DL models generated by well-known libraries to the restrictions of constrained microcontroller-based devices. In this work, a comprehensive discussion is provided regarding this novel ecosystem, by identifying the benefits that it will bring to the wearable industry and analysing different TinyDL initiatives promoted by tech giants. The specific use case of automatic user recognition from data captured by a wearable device is also presented. The whole development process by which different DL configurations have been embedded in a real microcontroller unit is described. The attained results in terms of accuracy and resource usage confirm the validity of the proposal, which allows precise predictions in a highly constrained platform with limited input information. Therefore, this work provides insights into the viability of the integration of TinyDL models within wearables, which may be valuable for researchers, practitioners, and makers related to this industry.</p>\",\"PeriodicalId\":50383,\"journal\":{\"name\":\"IET Computers and Digital Techniques\",\"volume\":\"16 1\",\"pages\":\"1-9\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2021-10-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/cdt2.12035\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IET Computers and Digital Techniques\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1049/cdt2.12035\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IET Computers and Digital Techniques","FirstCategoryId":"94","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/cdt2.12035","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Who is wearing me? TinyDL-based user recognition in constrained personal devices
Deep learning (DL) techniques have been extensively studied to improve their precision and scalability in a vast range of applications. Recently, a new milestone has been reached driven by the emergence of the TinyDL paradigm, which enables adaptation of complex DL models generated by well-known libraries to the restrictions of constrained microcontroller-based devices. In this work, a comprehensive discussion is provided regarding this novel ecosystem, by identifying the benefits that it will bring to the wearable industry and analysing different TinyDL initiatives promoted by tech giants. The specific use case of automatic user recognition from data captured by a wearable device is also presented. The whole development process by which different DL configurations have been embedded in a real microcontroller unit is described. The attained results in terms of accuracy and resource usage confirm the validity of the proposal, which allows precise predictions in a highly constrained platform with limited input information. Therefore, this work provides insights into the viability of the integration of TinyDL models within wearables, which may be valuable for researchers, practitioners, and makers related to this industry.
期刊介绍:
IET Computers & Digital Techniques publishes technical papers describing recent research and development work in all aspects of digital system-on-chip design and test of electronic and embedded systems, including the development of design automation tools (methodologies, algorithms and architectures). Papers based on the problems associated with the scaling down of CMOS technology are particularly welcome. It is aimed at researchers, engineers and educators in the fields of computer and digital systems design and test.
The key subject areas of interest are:
Design Methods and Tools: CAD/EDA tools, hardware description languages, high-level and architectural synthesis, hardware/software co-design, platform-based design, 3D stacking and circuit design, system on-chip architectures and IP cores, embedded systems, logic synthesis, low-power design and power optimisation.
Simulation, Test and Validation: electrical and timing simulation, simulation based verification, hardware/software co-simulation and validation, mixed-domain technology modelling and simulation, post-silicon validation, power analysis and estimation, interconnect modelling and signal integrity analysis, hardware trust and security, design-for-testability, embedded core testing, system-on-chip testing, on-line testing, automatic test generation and delay testing, low-power testing, reliability, fault modelling and fault tolerance.
Processor and System Architectures: many-core systems, general-purpose and application specific processors, computational arithmetic for DSP applications, arithmetic and logic units, cache memories, memory management, co-processors and accelerators, systems and networks on chip, embedded cores, platforms, multiprocessors, distributed systems, communication protocols and low-power issues.
Configurable Computing: embedded cores, FPGAs, rapid prototyping, adaptive computing, evolvable and statically and dynamically reconfigurable and reprogrammable systems, reconfigurable hardware.
Design for variability, power and aging: design methods for variability, power and aging aware design, memories, FPGAs, IP components, 3D stacking, energy harvesting.
Case Studies: emerging applications, applications in industrial designs, and design frameworks.