{"title":"数字电路物理设计指南中衬底噪声的定量表征","authors":"M. Nagata, J. Nagai, T. Morie, A. Iwata","doi":"10.1109/CICC.2000.852626","DOIUrl":null,"url":null,"abstract":"Substrate noise is quantitatively evaluated by gain calibrated substrate voltage measurements in a 100 ps-100 /spl mu/V resolution. Activity in a digital block is a key parameter to which the noise intensity is proportional, and its reduction is a straight and universal solution to suppress the noise. Use of Kelvin grounding in the source circuits and placing a guardband proximate to the receiver circuits together also attenuates the noise significantly, however, the effect is limited to the low frequency components such as ringing.","PeriodicalId":20702,"journal":{"name":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","volume":"48 1","pages":"95-98"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Quantitative characterization of substrate noise for physical design guides in digital circuits\",\"authors\":\"M. Nagata, J. Nagai, T. Morie, A. Iwata\",\"doi\":\"10.1109/CICC.2000.852626\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Substrate noise is quantitatively evaluated by gain calibrated substrate voltage measurements in a 100 ps-100 /spl mu/V resolution. Activity in a digital block is a key parameter to which the noise intensity is proportional, and its reduction is a straight and universal solution to suppress the noise. Use of Kelvin grounding in the source circuits and placing a guardband proximate to the receiver circuits together also attenuates the noise significantly, however, the effect is limited to the low frequency components such as ringing.\",\"PeriodicalId\":20702,\"journal\":{\"name\":\"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)\",\"volume\":\"48 1\",\"pages\":\"95-98\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2000.852626\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2000.852626","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Quantitative characterization of substrate noise for physical design guides in digital circuits
Substrate noise is quantitatively evaluated by gain calibrated substrate voltage measurements in a 100 ps-100 /spl mu/V resolution. Activity in a digital block is a key parameter to which the noise intensity is proportional, and its reduction is a straight and universal solution to suppress the noise. Use of Kelvin grounding in the source circuits and placing a guardband proximate to the receiver circuits together also attenuates the noise significantly, however, the effect is limited to the low frequency components such as ringing.
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