具有40nm CMOS轨到轨输出范围的鲁棒数字DC-DC变换器

2010 IEEE International Solid-State Circuits Conference - (ISSCC) Pub Date : 2010-03-18 DOI:10.1109/ISSCC.2010.5433987

E. Soenen, A. Roth, Justin Shi, M. Kinyua, J. Gaither, Elizabeth Ortynska

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引用次数: 41

摘要

手持消费电子产品的日益复杂和小尺寸是推动更多集成的动力。这增加了在高级工艺中对真正嵌入式DC-DC转换器的需求。传统的模拟DC-DC变换器结构不能很好地适应低电源电压。数字架构很有吸引力，但需要一个模数转换器(ADC)，这可能具有挑战性的设计[1-3]。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS

The growing complexity and small form factors of hand-held consumer electronics are the driving force of more integration. This increases the need for truly embedded DC-DC converters in advanced processes. Traditional analog DC-DC converter architectures do not fit well with low supply voltages. Digital architectures are attractive, but require an analog-to-digital converter (ADC), which can be challenging to design [1–3].

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2010 IEEE International Solid-State Circuits Conference - (ISSCC)

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