MEMS器件的低温键合技术

Anuroop, D. Bansal, Prem Kumar, M. Kaur, K. Rangra
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引用次数: 2

摘要

传统的键合技术,如熔合、玻璃熔块、焊接、共晶和阳极键合,已用于微机电系统(MEMS)的封装。这些键合技术需要高温,这会导致MEMS器件弯曲/屈曲,特别是在悬挂结构的情况下。在这项工作中,用市售的环氧树脂320 NC和光刻胶SU-8 2010进行了低温低成本的粘接技术。在室温下与市售的环氧320 NC键合会导致环氧树脂在器件区域内扩散,影响器件性能。为了确定连接环的尺寸,使用光刻胶SU 8 2010作为粘合剂。采用光刻技术实现了SU 8 2010键合环的尖锐尺寸。顶部硅帽是用TMAH蚀刻制造的。用这些技术制成的键具有良好的剪切强度,正如用本地装置测量的那样。
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Low temperature bonding techniques for MEMS devices
Conventional bonding techniques like fusion, glass frit, soldering, eutectic, and anodic bonding, have been used in packaging for micro-electro-mechanical systems (MEMS). These bonding techniques require high temperature which results in bending/buckling of MEMS devices especially in case of hanging structures. In this work, low temperature and low cost bonding techniques with commercially available epoxy 320 NC and photoresist SU-8 2010 are done. Bonding with commercially available epoxy 320 NC at room temperature leads to spreading of epoxy in device region and affects the device performance. To define bonding ring dimensions, photoresist SU 8 2010 is used as an adhesive. Sharp dimensions of SU 8 2010 bonding ring are achieved using lithography. Top silicon cap is fabricated using TMAH etching. The bonds made with these techniques gave good shear strength, as measured with an indigenous setup.
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