场敏感扫描探针显微镜尖端修饰的局部两步电替换

Chun-Ting Lin, M. Chang, Yu-Wei Chen, Shu-Hung Tung, Nancy Chu, C. Hsiao, M. Shiao
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引用次数: 1

摘要

本文采用局部两步电替换法制备了一种装饰尖端的铂银复合纳米点(Pt@Ag ND)。在第一次取代中,通过氟离子辅助电取代反应,将硅离子与银离子相互取代,制备Ag-ND尖端。在第二次置换中,银与氯铂酸相互作用使银ND进一步转化为Pt。我们的初步结果证明了制备单金属纳米点(metal-ND)或核壳结构修饰的尖端尖端用于场敏感扫描探针显微镜(FS-SPM)应用的可能性。
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Localized two-step galvanic replacement of a tip apex modification for field sensitive scanning probe microscopy
In this paper, a platinum-silver composite nano-dot (Pt@Ag ND) decorated tip apex was successfully fabricated by utilizing a localized two-step galvanic replacement. In the first replacement, Ag-ND tip was prepared by the replacement between silicon and silver ion through fluoride assisted galvanic replacement reaction. In the second replacement, the Ag ND was further changed to Pt by the interaction between Ag and chloroplatinic acid. Our preliminary results demonstrated the possibility of preparing either a single metal-nanodot (metal-ND) or core-shell structure modified tip apexes for field sensitive scanning probe microscopy (FS-SPM) applications.
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