{"title":"耗尽模式MOS电容建模研究","authors":"C. Tseng, Yuan Sheng Wang","doi":"10.1109/CSTIC.2017.7919748","DOIUrl":null,"url":null,"abstract":"A depletion-mode MOS (DMOS) capacitor modeling methodology with high accuracy and feasibility is proposed. Currently, it is lack of compact model relevant DMOS capacitor modeling but it is significant importance in A/D converters (ADCs) for CMOS image sensor circuit. This modeling methodology not only could provide good accuracy on geometry scaling but also with voltage and temperature sensitivity.","PeriodicalId":6846,"journal":{"name":"2017 China Semiconductor Technology International Conference (CSTIC)","volume":"44 9 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Depletion-mode MOS capacitor modeling investigation\",\"authors\":\"C. Tseng, Yuan Sheng Wang\",\"doi\":\"10.1109/CSTIC.2017.7919748\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A depletion-mode MOS (DMOS) capacitor modeling methodology with high accuracy and feasibility is proposed. Currently, it is lack of compact model relevant DMOS capacitor modeling but it is significant importance in A/D converters (ADCs) for CMOS image sensor circuit. This modeling methodology not only could provide good accuracy on geometry scaling but also with voltage and temperature sensitivity.\",\"PeriodicalId\":6846,\"journal\":{\"name\":\"2017 China Semiconductor Technology International Conference (CSTIC)\",\"volume\":\"44 9 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 China Semiconductor Technology International Conference (CSTIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSTIC.2017.7919748\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC.2017.7919748","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Depletion-mode MOS capacitor modeling investigation
A depletion-mode MOS (DMOS) capacitor modeling methodology with high accuracy and feasibility is proposed. Currently, it is lack of compact model relevant DMOS capacitor modeling but it is significant importance in A/D converters (ADCs) for CMOS image sensor circuit. This modeling methodology not only could provide good accuracy on geometry scaling but also with voltage and temperature sensitivity.