{"title":"屏蔽机柜通风口和插槽的电磁干扰建模","authors":"B. Archambeault","doi":"10.1109/ISEMC.1992.626047","DOIUrl":null,"url":null,"abstract":"Author: Bruce Archambeault Digital Equipment Corporation This paper describes the development of a modeling tool to predict EM1 radiation from air vent panels, slots, and other openings in shielded devices. The model uses a conducting wire behind the openings rather than a farfield plane wave and predicts the received EM1 strength at typical FCC distances from these openings. The model allows overall dimensions of the vent, thickness of the vent, as well as number, spacing, and orientation of the holes to be varied. Rapid comparisons between existing and proposed slot lengths, air vent openings, and tolerance analysis are possible.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"49 1","pages":"44-51"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"EMI Modeling Of Air Vents And Slots In Shielded Cabinets\",\"authors\":\"B. Archambeault\",\"doi\":\"10.1109/ISEMC.1992.626047\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Author: Bruce Archambeault Digital Equipment Corporation This paper describes the development of a modeling tool to predict EM1 radiation from air vent panels, slots, and other openings in shielded devices. The model uses a conducting wire behind the openings rather than a farfield plane wave and predicts the received EM1 strength at typical FCC distances from these openings. The model allows overall dimensions of the vent, thickness of the vent, as well as number, spacing, and orientation of the holes to be varied. Rapid comparisons between existing and proposed slot lengths, air vent openings, and tolerance analysis are possible.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"49 1\",\"pages\":\"44-51\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1992.626047\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626047","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
EMI Modeling Of Air Vents And Slots In Shielded Cabinets
Author: Bruce Archambeault Digital Equipment Corporation This paper describes the development of a modeling tool to predict EM1 radiation from air vent panels, slots, and other openings in shielded devices. The model uses a conducting wire behind the openings rather than a farfield plane wave and predicts the received EM1 strength at typical FCC distances from these openings. The model allows overall dimensions of the vent, thickness of the vent, as well as number, spacing, and orientation of the holes to be varied. Rapid comparisons between existing and proposed slot lengths, air vent openings, and tolerance analysis are possible.
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