J. Altepeter, D. Branning, E. Jeffrey, C. Wei, P. Kwiat, R. Thew, J. O'Brien, M. Nielsen, A.G. White
{"title":"单量子位，纠缠辅助和辅助量子过程断层扫描","authors":"J. Altepeter, D. Branning, E. Jeffrey, C. Wei, P. Kwiat, R. Thew, J. O'Brien, M. Nielsen, A.G. White","doi":"10.1109/QELS.2003.238205","DOIUrl":null,"url":null,"abstract":"Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.","PeriodicalId":20418,"journal":{"name":"Postconference Digest Quantum Electronics and Laser Science, 2003. QELS.","volume":"265 1","pages":"3 pp.-"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography\",\"authors\":\"J. Altepeter, D. Branning, E. Jeffrey, C. Wei, P. Kwiat, R. Thew, J. O'Brien, M. Nielsen, A.G. White\",\"doi\":\"10.1109/QELS.2003.238205\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.\",\"PeriodicalId\":20418,\"journal\":{\"name\":\"Postconference Digest Quantum Electronics and Laser Science, 2003. QELS.\",\"volume\":\"265 1\",\"pages\":\"3 pp.-\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-06-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Postconference Digest Quantum Electronics and Laser Science, 2003. QELS.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/QELS.2003.238205\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Postconference Digest Quantum Electronics and Laser Science, 2003. QELS.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QELS.2003.238205","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography
Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.
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