基于ev和ve度的碳化硅拓扑指数研究

{"title":"基于ev和ve度的碳化硅拓扑指数研究","authors":"Jung Rye Lee, Aftab Hussain, A. Fahad, Ali Raza, Muhammad Imran Qureshi, A. Mahboob, Choonkill Park","doi":"10.32604/cmes.2022.016836","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":10451,"journal":{"name":"Cmes-computer Modeling in Engineering & Sciences","volume":"7 1","pages":""},"PeriodicalIF":2.2000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"On ev and ve-Degree Based Topological Indices of Silicon Carbides\",\"authors\":\"Jung Rye Lee, Aftab Hussain, A. Fahad, Ali Raza, Muhammad Imran Qureshi, A. Mahboob, Choonkill Park\",\"doi\":\"10.32604/cmes.2022.016836\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":10451,\"journal\":{\"name\":\"Cmes-computer Modeling in Engineering & Sciences\",\"volume\":\"7 1\",\"pages\":\"\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2022-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Cmes-computer Modeling in Engineering & Sciences\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.32604/cmes.2022.016836\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Cmes-computer Modeling in Engineering & Sciences","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.32604/cmes.2022.016836","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}