{"title":"涉及金属表面的受挫全反射理论。","authors":"T. R. Young, B. Rothrock","doi":"10.6028/JRES.067A.012","DOIUrl":null,"url":null,"abstract":"The theory for frustrated total reflection has been developed for the case where the third medium is metallic of complex index. Using parallel polarized light a unique minimum in reflectance occurs at a definite film thickness. Experimental verification of the theory is made and indicates the theory applicable to the precise measurement of thin contact films existing between metallic and dielectric surfaces.","PeriodicalId":94340,"journal":{"name":"Journal of research of the National Bureau of Standards. Section A, Physics and chemistry","volume":"582 1","pages":"115-125"},"PeriodicalIF":0.0000,"publicationDate":"1963-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Theory of Frustrated Total Reflection Involving Metallic Surfaces.\",\"authors\":\"T. R. Young, B. Rothrock\",\"doi\":\"10.6028/JRES.067A.012\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The theory for frustrated total reflection has been developed for the case where the third medium is metallic of complex index. Using parallel polarized light a unique minimum in reflectance occurs at a definite film thickness. Experimental verification of the theory is made and indicates the theory applicable to the precise measurement of thin contact films existing between metallic and dielectric surfaces.\",\"PeriodicalId\":94340,\"journal\":{\"name\":\"Journal of research of the National Bureau of Standards. Section A, Physics and chemistry\",\"volume\":\"582 1\",\"pages\":\"115-125\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1963-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of research of the National Bureau of Standards. Section A, Physics and chemistry\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.6028/JRES.067A.012\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of research of the National Bureau of Standards. Section A, Physics and chemistry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.6028/JRES.067A.012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Theory of Frustrated Total Reflection Involving Metallic Surfaces.
The theory for frustrated total reflection has been developed for the case where the third medium is metallic of complex index. Using parallel polarized light a unique minimum in reflectance occurs at a definite film thickness. Experimental verification of the theory is made and indicates the theory applicable to the precise measurement of thin contact films existing between metallic and dielectric surfaces.
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