Constraint random stimuli and functional coverage on mixed signal verification

With a constantly increasing complexity, developing today's IC is more challenging not only in design, but also in integration and verification. The new approach is to use the same tools and methodologies from digital verification and to extended them to mixed signal, resulting a metric driven functional and electrical verification. In this paper the reasons for using this technique will be described, together with methodology and environment, providing also, as a demonstration and an argument, a practical example.