{"title":"GaN HEMT栅极驱动器瞬态增强LDO电路设计","authors":"Li Wang, De-Zhong Zhou, Ningye He, Yuan Xu, Xiaoxiong He, Zhenhai Chen","doi":"10.1109/ICICM54364.2021.9660317","DOIUrl":null,"url":null,"abstract":"A dynamic bias transient enhanced LDO (Low Dropout regulator) circuit for GaN gate driver is presented in this paper. With high-speed comparator, the bias current of LDO error amplifier can be switched dynamically when large load occurs. The reference voltage of high-speed comparator determines the response time of dynamic bias control circuit. The LDO has been designed in 0.18 μm BCD (Bipolar-CMOS-DMOS) process, simulation results show that the proposed LDO undershoot voltage is 16.6% of output voltage and the recovery time is less than 0.5us when load current is changed from 0mA to 20mA by frequency is 1MHZ.","PeriodicalId":6693,"journal":{"name":"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"1 1","pages":"40-44"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design of Transient Enhanced LDO Circuit for GaN HEMT Gate Driver\",\"authors\":\"Li Wang, De-Zhong Zhou, Ningye He, Yuan Xu, Xiaoxiong He, Zhenhai Chen\",\"doi\":\"10.1109/ICICM54364.2021.9660317\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A dynamic bias transient enhanced LDO (Low Dropout regulator) circuit for GaN gate driver is presented in this paper. With high-speed comparator, the bias current of LDO error amplifier can be switched dynamically when large load occurs. The reference voltage of high-speed comparator determines the response time of dynamic bias control circuit. The LDO has been designed in 0.18 μm BCD (Bipolar-CMOS-DMOS) process, simulation results show that the proposed LDO undershoot voltage is 16.6% of output voltage and the recovery time is less than 0.5us when load current is changed from 0mA to 20mA by frequency is 1MHZ.\",\"PeriodicalId\":6693,\"journal\":{\"name\":\"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)\",\"volume\":\"1 1\",\"pages\":\"40-44\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICM54364.2021.9660317\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICM54364.2021.9660317","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of Transient Enhanced LDO Circuit for GaN HEMT Gate Driver
A dynamic bias transient enhanced LDO (Low Dropout regulator) circuit for GaN gate driver is presented in this paper. With high-speed comparator, the bias current of LDO error amplifier can be switched dynamically when large load occurs. The reference voltage of high-speed comparator determines the response time of dynamic bias control circuit. The LDO has been designed in 0.18 μm BCD (Bipolar-CMOS-DMOS) process, simulation results show that the proposed LDO undershoot voltage is 16.6% of output voltage and the recovery time is less than 0.5us when load current is changed from 0mA to 20mA by frequency is 1MHZ.
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