{"title":"单轴和双轴取向聚碳酸酯电容器薄膜的形态和介电性能","authors":"S. Yen, L. Lowry, C. Bankston, V. Capozzi","doi":"10.1109/CEIDP.1989.69575","DOIUrl":null,"url":null,"abstract":"A reflective X-ray diffraction method developed to determine the absolute X/sub c/ (crystallinity) of UX and BX (uniaxially and biaxially oriented) PC (polycarbonate) film is described. Conditions for achieving optimum properties for producing BX high-X/sub c/ and isotropic PC film were found. For BX PC film of identical thickness to UX PC film the electric breakdown strength was found to be proportional to X/sub c/. The thermal and mechanical properties as well as the direct-current electric breakdown strengths of the newly developed isotropic high-X/sub c/ BX PC film are compared with those of the anisotropic commercial PC capacitor film. Capacitors made from the high-X/sub c/ isotropic BX PC film when subjected to a 1000-hour 100 degrees C, 42-V DC life test showed no change in dissipation factor and no change in capacitance, and they met 100 degrees C insulation resistance test requirements. In general, it is concluded that this novel BX PC film is much superior to the traditional UX commercial capacitor PC film.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"14 1","pages":"375-383"},"PeriodicalIF":0.0000,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Morphology and dielectric properties of uniaxially and biaxially-oriented polycarbonate capacitor films\",\"authors\":\"S. Yen, L. Lowry, C. Bankston, V. Capozzi\",\"doi\":\"10.1109/CEIDP.1989.69575\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A reflective X-ray diffraction method developed to determine the absolute X/sub c/ (crystallinity) of UX and BX (uniaxially and biaxially oriented) PC (polycarbonate) film is described. Conditions for achieving optimum properties for producing BX high-X/sub c/ and isotropic PC film were found. For BX PC film of identical thickness to UX PC film the electric breakdown strength was found to be proportional to X/sub c/. The thermal and mechanical properties as well as the direct-current electric breakdown strengths of the newly developed isotropic high-X/sub c/ BX PC film are compared with those of the anisotropic commercial PC capacitor film. Capacitors made from the high-X/sub c/ isotropic BX PC film when subjected to a 1000-hour 100 degrees C, 42-V DC life test showed no change in dissipation factor and no change in capacitance, and they met 100 degrees C insulation resistance test requirements. In general, it is concluded that this novel BX PC film is much superior to the traditional UX commercial capacitor PC film.<<ETX>>\",\"PeriodicalId\":10719,\"journal\":{\"name\":\"Conference on Electrical Insulation and Dielectric Phenomena,\",\"volume\":\"14 1\",\"pages\":\"375-383\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on Electrical Insulation and Dielectric Phenomena,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1989.69575\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Electrical Insulation and Dielectric Phenomena,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1989.69575","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Morphology and dielectric properties of uniaxially and biaxially-oriented polycarbonate capacitor films
A reflective X-ray diffraction method developed to determine the absolute X/sub c/ (crystallinity) of UX and BX (uniaxially and biaxially oriented) PC (polycarbonate) film is described. Conditions for achieving optimum properties for producing BX high-X/sub c/ and isotropic PC film were found. For BX PC film of identical thickness to UX PC film the electric breakdown strength was found to be proportional to X/sub c/. The thermal and mechanical properties as well as the direct-current electric breakdown strengths of the newly developed isotropic high-X/sub c/ BX PC film are compared with those of the anisotropic commercial PC capacitor film. Capacitors made from the high-X/sub c/ isotropic BX PC film when subjected to a 1000-hour 100 degrees C, 42-V DC life test showed no change in dissipation factor and no change in capacitance, and they met 100 degrees C insulation resistance test requirements. In general, it is concluded that this novel BX PC film is much superior to the traditional UX commercial capacitor PC film.<>
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